Design and Realization of Charge Measurement System Based on VA32TA5
文献类型：期刊论文
| 作者 | Ren Yiwen; Guo Jianhua; Wang Shen |
| 刊名 | Chinese Journal of Space Science
 |
| 出版日期 | 2016 |
| 卷号 | 36期号:3页码:395-400 |
| 英文摘要 | Semiconductor detector has lots of advantages, such as good resolution, high sensitivity and wide linear range, which make it the most widely used detector in space exploration of X/gamma Ray. Semiconductor detection system has strict requirements on its electronics system's noise level and measurement accuracy. Aiming at these requirements, a new charge measurement system based on the multi-channel charge measurement chip VA32TA5 is designed. This paper gives a detailed introduction of the system's design principle and implementation procedure, and also gives the preliminary results of performance at the end. Testing results indicate that the system has low noise and good linearity and therefore can be applied to semiconductor detectors, e.g. silicon strip detector, CdZnTe detector. |
| 源URL | [http://libir.pmo.ac.cn/handle/332002/16815]  |
| 专题 | 紫金山天文台_暗物质和空间天文实验室 |
| 推荐引用方式 GB/T 7714 | Ren Yiwen,Guo Jianhua,Wang Shen. Design and Realization of Charge Measurement System Based on VA32TA5[J]. Chinese Journal of Space Science,2016,36(3):395-400. |
| APA | Ren Yiwen,Guo Jianhua,&Wang Shen.(2016).Design and Realization of Charge Measurement System Based on VA32TA5.Chinese Journal of Space Science,36(3),395-400. |
| MLA | Ren Yiwen,et al."Design and Realization of Charge Measurement System Based on VA32TA5".Chinese Journal of Space Science 36.3(2016):395-400. |
入库方式： OAI收割
来源：紫金山天文台
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