Single Grain Boundary Break Junction for Suspended Nanogap Electrodes with Gapwidth Down to 1-2 nm by Focused Ion Beam Milling
文献类型：期刊论文
| 作者 | Cui, AJ ; Liu, Z ; Dong, HL ; Wang, YJ ; Zhen, YG ; Li, WX ; Li, JJ ; Gu, CZ ; Hu, WP |
| 刊名 | ADVANCED MATERIALS
 |
| 出版日期 | 2015 |
| 卷号 | 27期号:19页码:3002 |
| 公开日期 | 2016-12-26 |
| 源URL | [http://ir.iphy.ac.cn/handle/311004/60216]  |
| 专题 | 物理研究所_物理所公开发表论文_物理所公开发表论文_期刊论文 |
| 推荐引用方式 GB/T 7714 | Cui, AJ,Liu, Z,Dong, HL,et al. Single Grain Boundary Break Junction for Suspended Nanogap Electrodes with Gapwidth Down to 1-2 nm by Focused Ion Beam Milling[J]. ADVANCED MATERIALS,2015,27(19):3002. |
| APA | Cui, AJ.,Liu, Z.,Dong, HL.,Wang, YJ.,Zhen, YG.,...&Hu, WP.(2015).Single Grain Boundary Break Junction for Suspended Nanogap Electrodes with Gapwidth Down to 1-2 nm by Focused Ion Beam Milling.ADVANCED MATERIALS,27(19),3002. |
| MLA | Cui, AJ,et al."Single Grain Boundary Break Junction for Suspended Nanogap Electrodes with Gapwidth Down to 1-2 nm by Focused Ion Beam Milling".ADVANCED MATERIALS 27.19(2015):3002. |
入库方式： OAI收割
来源：物理研究所
浏览0
下载0
收藏0
其他版本
除非特别说明，本系统中所有内容都受版权保护，并保留所有权利。