中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
A study of 2DEG properties in AlGaN/GaN heterostructure using GaN/AlN superlattice as barrier layers grown by MOCVD

文献类型:期刊论文

作者Chen, FS ; Chen, H ; Deng, Z ; Lu, TP ; Fang, YT ; Jiang, Y ; Ma, ZG ; He, M
刊名APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING
出版日期2015
卷号118期号:4页码:1453
公开日期2016-12-26
源URL[http://ir.iphy.ac.cn/handle/311004/60253]  
专题物理研究所_物理所公开发表论文_物理所公开发表论文_期刊论文
推荐引用方式
GB/T 7714
Chen, FS,Chen, H,Deng, Z,et al. A study of 2DEG properties in AlGaN/GaN heterostructure using GaN/AlN superlattice as barrier layers grown by MOCVD[J]. APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING,2015,118(4):1453.
APA Chen, FS.,Chen, H.,Deng, Z.,Lu, TP.,Fang, YT.,...&He, M.(2015).A study of 2DEG properties in AlGaN/GaN heterostructure using GaN/AlN superlattice as barrier layers grown by MOCVD.APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING,118(4),1453.
MLA Chen, FS,et al."A study of 2DEG properties in AlGaN/GaN heterostructure using GaN/AlN superlattice as barrier layers grown by MOCVD".APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING 118.4(2015):1453.

入库方式: OAI收割

来源:物理研究所

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