New method for fast morphological characterization of organic polycrystalline films by polarized optical microscopy
文献类型：期刊论文
| 作者 | He, XC ; Yang, JB ; Yan, DH ; Weng, YX |
| 刊名 | CHINESE PHYSICS B
 |
| 出版日期 | 2015 |
| 卷号 | 24期号:7 |
| 公开日期 | 2016-12-26 |
| 源URL | [http://ir.iphy.ac.cn/handle/311004/60449]  |
| 专题 | 物理研究所_物理所公开发表论文_物理所公开发表论文_期刊论文 |
| 推荐引用方式 GB/T 7714 | He, XC,Yang, JB,Yan, DH,et al. New method for fast morphological characterization of organic polycrystalline films by polarized optical microscopy[J]. CHINESE PHYSICS B,2015,24(7). |
| APA | He, XC,Yang, JB,Yan, DH,&Weng, YX.(2015).New method for fast morphological characterization of organic polycrystalline films by polarized optical microscopy.CHINESE PHYSICS B,24(7). |
| MLA | He, XC,et al."New method for fast morphological characterization of organic polycrystalline films by polarized optical microscopy".CHINESE PHYSICS B 24.7(2015). |
入库方式： OAI收割
来源：物理研究所
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