AutoFP: a GUI for highly automated Rietveld refinement using an expert system algorithm based on FullProf
文献类型：期刊论文
| 作者 | Cui, XP ; Feng, ZJ ; Jin, Y ; Cao, YM ; Deng, DM ; Chu, H ; Cao, SX ; Dong, C ; Zhang, JC |
| 刊名 | JOURNAL OF APPLIED CRYSTALLOGRAPHY
 |
| 出版日期 | 2015 |
| 卷号 | 48页码:1581 |
| 公开日期 | 2016-12-26 |
| 源URL | [http://ir.iphy.ac.cn/handle/311004/60675]  |
| 专题 | 物理研究所_物理所公开发表论文_物理所公开发表论文_期刊论文 |
| 推荐引用方式 GB/T 7714 | Cui, XP,Feng, ZJ,Jin, Y,et al. AutoFP: a GUI for highly automated Rietveld refinement using an expert system algorithm based on FullProf[J]. JOURNAL OF APPLIED CRYSTALLOGRAPHY,2015,48:1581. |
| APA | Cui, XP.,Feng, ZJ.,Jin, Y.,Cao, YM.,Deng, DM.,...&Zhang, JC.(2015).AutoFP: a GUI for highly automated Rietveld refinement using an expert system algorithm based on FullProf.JOURNAL OF APPLIED CRYSTALLOGRAPHY,48,1581. |
| MLA | Cui, XP,et al."AutoFP: a GUI for highly automated Rietveld refinement using an expert system algorithm based on FullProf".JOURNAL OF APPLIED CRYSTALLOGRAPHY 48(2015):1581. |
入库方式： OAI收割
来源：物理研究所
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