In situ fabrication and optoelectronic analysis of axial CdS/p-Si nanowire heterojunctions in a high-resolution transmission electron microscope
文献类型：期刊论文
| 作者 | Zhang, C ; Xu, Z ; Tian, W ; Tang, DM ; Wang, X ; Bando, Y ; Fukata, N ; Golberg, D |
| 刊名 | NANOTECHNOLOGY
 |
| 出版日期 | 2015 |
| 卷号 | 26期号:15 |
| 公开日期 | 2016-12-26 |
| 源URL | [http://ir.iphy.ac.cn/handle/311004/60693]  |
| 专题 | 物理研究所_物理所公开发表论文_物理所公开发表论文_期刊论文 |
| 推荐引用方式 GB/T 7714 | Zhang, C,Xu, Z,Tian, W,et al. In situ fabrication and optoelectronic analysis of axial CdS/p-Si nanowire heterojunctions in a high-resolution transmission electron microscope[J]. NANOTECHNOLOGY,2015,26(15). |
| APA | Zhang, C.,Xu, Z.,Tian, W.,Tang, DM.,Wang, X.,...&Golberg, D.(2015).In situ fabrication and optoelectronic analysis of axial CdS/p-Si nanowire heterojunctions in a high-resolution transmission electron microscope.NANOTECHNOLOGY,26(15). |
| MLA | Zhang, C,et al."In situ fabrication and optoelectronic analysis of axial CdS/p-Si nanowire heterojunctions in a high-resolution transmission electron microscope".NANOTECHNOLOGY 26.15(2015). |
入库方式： OAI收割
来源：物理研究所
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