中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
Deposition of thick Si coating with low residual stress on SiC ceramics by fabricating multilayer with compressive/tensile stress layer-pairs

文献类型:期刊论文

作者Yang, Yong1; Zhang, Junwei1,2; Fu, Chaoli1,3; Liu, Guiling1; Liu, Yan1; Yao, Xiumin1; Liu, Xuejian1; Chen, Zhongming1; Huang, Zhengren1
刊名MATERIALS & DESIGN
出版日期2016-10-05
卷号107页码:1-6
关键词SiC ceramics Surface modification Silicon laminated coatings Low residual stress
英文摘要Surface modification can significantly improve surface properties of lightweight SiC ceramics as optical component for Large Space Optical Telescope. Usually, thick Si-modified coatings can be applied to cover surface defects and decrease polishing cost/time of SiC ceramics. However, it is one great challenge for depositing thick Si-coating with low residual stress on large-scale SiC ceramics by physical vapor deposition (PVD) method because too large residual stress often leads to the stress cracking of thick coatings. Here, silicon multilayer with alternate compressive/tensile stress layer pairs was designed and deposited alternately onto SiC substrates in order to prepare thick Si-coatings with low residual stresses. The silicon multilayer with compressive/tensile stress pairs were obtained by plasma ion assisted deposition and electron beam physical vapor deposition, respectively. The total thickness of as-deposited Si-multilayer can reach as much as 20 pm. Remarkably, the residual stress of silicon-multilayer tends to be negligible. Meanwhile, thick Si-coating bonds tightly with SiC substrate, and shows ultra-flat mirror surface with surface roughness of 0.69 nm RMS after polishing. It is demonstrated that silicon multilayer with low residual stress is a promising way to realize surface modification of SiC ceramics for optical mirror application. (C) 2016 Elsevier Ltd. All rights reserved.
WOS标题词Science & Technology ; Technology
类目[WOS]Materials Science, Multidisciplinary
研究领域[WOS]Materials Science
关键词[WOS]CHEMICAL-VAPOR-DEPOSITION ; SILICON-CARBIDE CERAMICS ; MECHANICAL-PROPERTIES ; FILMS ; MICROSTRUCTURE ; PROPERTY ; STRENGTH ; MIRRORS
收录类别SCI
语种英语
WOS记录号WOS:000381532800001
源URL[http://ir.sic.ac.cn/handle/331005/22112]  
专题上海硅酸盐研究所_结构陶瓷与复合材料工程研究中心_期刊论文
作者单位1.Chinese Acad Sci, Shanghai Inst Ceram, State Key Lab High Performance Ceram & Superfine, 1295 Dingxi Rd, Shanghai 200050, Peoples R China
2.Univ Chinese Acad Sci, 19 Yuquan Rd, Beijing 100039, Peoples R China
3.Shanghai Univ, 99 Shangda Rd, Shanghai 200444, Peoples R China
推荐引用方式
GB/T 7714
Yang, Yong,Zhang, Junwei,Fu, Chaoli,et al. Deposition of thick Si coating with low residual stress on SiC ceramics by fabricating multilayer with compressive/tensile stress layer-pairs[J]. MATERIALS & DESIGN,2016,107:1-6.
APA Yang, Yong.,Zhang, Junwei.,Fu, Chaoli.,Liu, Guiling.,Liu, Yan.,...&Huang, Zhengren.(2016).Deposition of thick Si coating with low residual stress on SiC ceramics by fabricating multilayer with compressive/tensile stress layer-pairs.MATERIALS & DESIGN,107,1-6.
MLA Yang, Yong,et al."Deposition of thick Si coating with low residual stress on SiC ceramics by fabricating multilayer with compressive/tensile stress layer-pairs".MATERIALS & DESIGN 107(2016):1-6.

入库方式: OAI收割

来源:上海硅酸盐研究所

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