Capture-Power-Aware Test Data Compression Using Selective Encoding
文献类型：期刊论文
| 作者 | Jia Li; Xiao Liu; Yubin Zhang; Yu Hu; Xiaowei Li; Qiang Xu |
| 刊名 | INTEGRATION-THE VLSI JOURNAL
 |
| 出版日期 | 2011 |
| 卷号 | 44期号:3页码:205-216 |
| 英文摘要 | Ever-increasing test data volume and excessive test power are two of the main concerns of VLSI testing. The "don't-care" bits (also known as X-bits) in giventest cube can be exploited for test data compression and/or test power reduction, and these techniques may contradict to each other because the very same X-bits are likely to be used for different optimization objectives. This paper proposes a capture-power-aware test compression scheme that is able to keepcapture-power under a safe limit with low test compression ratio loss. Experimental results on benchmark circuits validate the effectiveness of the proposed solution. |
| 收录类别 | SCI |
| 原文出处 | http://www.sciencedirect.com/science/article/pii/S0167926011000204 |
| 语种 | 英语 |
| 源URL | [http://ir.siat.ac.cn:8080/handle/172644/3245]  |
| 专题 | 深圳先进技术研究院_集成所 |
| 作者单位 | INTEGRATION-THE VLSI JOURNAL |
| 推荐引用方式 GB/T 7714 | Jia Li,Xiao Liu,Yubin Zhang,et al. Capture-Power-Aware Test Data Compression Using Selective Encoding[J]. INTEGRATION-THE VLSI JOURNAL,2011,44(3):205-216. |
| APA | Jia Li,Xiao Liu,Yubin Zhang,Yu Hu,Xiaowei Li,&Qiang Xu.(2011).Capture-Power-Aware Test Data Compression Using Selective Encoding.INTEGRATION-THE VLSI JOURNAL,44(3),205-216. |
| MLA | Jia Li,et al."Capture-Power-Aware Test Data Compression Using Selective Encoding".INTEGRATION-THE VLSI JOURNAL 44.3(2011):205-216. |
入库方式： OAI收割
来源：深圳先进技术研究院
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