Test economics for Homogeneous manycore systems
文献类型：会议论文
| 作者 | Lin Huang; Qiang Xu |
| 出版日期 | 2009 |
| 会议名称 | International Test Conference, ITC 2009 |
| 英文摘要 | Homogeneous manycore systems that contain a large number of structurally identical cores are emerging for tera-scale computation. To ensure the required quality and reliability of such complex integrated circuits before supplying them to final users, extensive manufacturing tests need to be conducted and the associated test cost can account for a great share of the total production cost. By introducing spare cores on-chip, the burn-in testtime can be shortened and the defect coverage requirements for core tests can be also relaxed, without sacrificing quality of the shipped products. The above test cost reduction is likely to exceed/compensate the manufacturing cost of the extra cores, thus reducing the total production cost ofmanycore systems. We develop novel analytical models that capture the above tradeoff in this paper and we verify the effectiveness of the proposedtest economics model for hypothetical manycore systems with various configurations. |
| 收录类别 | EI |
| 语种 | 英语 |
| 源URL | [http://ir.siat.ac.cn:8080/handle/172644/2506]  |
| 专题 | 深圳先进技术研究院_集成所 |
| 作者单位 | 2009 |
| 推荐引用方式 GB/T 7714 | Lin Huang,Qiang Xu. Test economics for Homogeneous manycore systems[C]. 见:International Test Conference, ITC 2009. |
入库方式： OAI收割
来源：深圳先进技术研究院
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