Principal Line-Based Alignment Refinement for Palmprint Recognition
文献类型：期刊论文
| 作者 | Wei Li; Zhang, B.; Lei Zhang; Jingqi Yan |
| 刊名 | IEEE TRANSACTIONS ON SYSTEMS MAN AND CYBERNETICS PART C-APPLICATIONS AND REVIEWS
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| 出版日期 | 2012 |
| 英文摘要 | Image alignment is an important step in various biometric authentication applications such as palmprint recognition. Most of the existing palmprint alignment methods make use of some key points between fingers or in palm boundary to establish the local coordinate system for region of interest (ROI) extraction. The ROI is consequently used for feature extraction and matching. Such alignment methods usually yield a coarse alignment of the palmprint images, while many missed and false matches are actually caused by inaccurate image alignments. To improve the palmprint verification accuracy, in this paper, we present an efficient palmprint alignment refinement method. After extracting the principal lines from the palmprint image, we apply the iterative closest point method to them to estimate the translation and rotation parameters between two images. The estimated parameters are then used to refine the alignment of palmprint feature maps for a more accurate palmprint matching. The experimental results show that the proposed method greatly improves the palmprint recognition accuracy and it works in real time. |
| 收录类别 | SCI |
| 原文出处 | http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=6203425 |
| 语种 | 英语 |
| 源URL | [http://ir.siat.ac.cn:8080/handle/172644/4305]  |
| 专题 | 深圳先进技术研究院_其他 |
| 作者单位 | IEEE TRANSACTIONS ON SYSTEMS MAN AND CYBERNETICS PART C-APPLICATIONS AND REVIEWS |
| 推荐引用方式 GB/T 7714 | Wei Li,Zhang, B.,Lei Zhang,et al. Principal Line-Based Alignment Refinement for Palmprint Recognition[J]. IEEE TRANSACTIONS ON SYSTEMS MAN AND CYBERNETICS PART C-APPLICATIONS AND REVIEWS,2012. |
| APA | Wei Li,Zhang, B.,Lei Zhang,&Jingqi Yan.(2012).Principal Line-Based Alignment Refinement for Palmprint Recognition.IEEE TRANSACTIONS ON SYSTEMS MAN AND CYBERNETICS PART C-APPLICATIONS AND REVIEWS. |
| MLA | Wei Li,et al."Principal Line-Based Alignment Refinement for Palmprint Recognition".IEEE TRANSACTIONS ON SYSTEMS MAN AND CYBERNETICS PART C-APPLICATIONS AND REVIEWS (2012). |
入库方式： OAI收割
来源：深圳先进技术研究院
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