An accelerated test method of luminous flux depreciation for LED luminaires and lamps
文献类型：期刊论文
| 作者 | C. Qian ; X.J.Fan ; J.J.Fan ; C.A.Yuan ; G.Q.Zhang |
| 刊名 | reliability engineering and system safety
 |
| 出版日期 | 2016 |
| 卷号 | 147页码:84-92 |
| 学科主题 | 半导体器件 |
| 收录类别 | SCI |
| 公开日期 | 2017-03-16 |
| 源URL | [http://ir.semi.ac.cn/handle/172111/28091]  |
| 专题 | 半导体研究所_中科院半导体照明研发中心 |
| 推荐引用方式 GB/T 7714 | C. Qian,X.J.Fan,J.J.Fan,et al. An accelerated test method of luminous flux depreciation for LED luminaires and lamps[J]. reliability engineering and system safety,2016,147:84-92. |
| APA | C. Qian,X.J.Fan,J.J.Fan,C.A.Yuan,&G.Q.Zhang.(2016).An accelerated test method of luminous flux depreciation for LED luminaires and lamps.reliability engineering and system safety,147,84-92. |
| MLA | C. Qian,et al."An accelerated test method of luminous flux depreciation for LED luminaires and lamps".reliability engineering and system safety 147(2016):84-92. |
入库方式： OAI收割
来源：半导体研究所
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