中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
An accelerated test method of luminous flux depreciation for LED luminaires and lamps

文献类型:期刊论文

作者C. Qian ; X.J.Fan ; J.J.Fan ; C.A.Yuan ; G.Q.Zhang
刊名reliability engineering and system safety
出版日期2016
卷号147页码:84-92
学科主题半导体器件
收录类别SCI
公开日期2017-03-16
源URL[http://ir.semi.ac.cn/handle/172111/28091]  
专题半导体研究所_中科院半导体照明研发中心
推荐引用方式
GB/T 7714
C. Qian,X.J.Fan,J.J.Fan,et al. An accelerated test method of luminous flux depreciation for LED luminaires and lamps[J]. reliability engineering and system safety,2016,147:84-92.
APA C. Qian,X.J.Fan,J.J.Fan,C.A.Yuan,&G.Q.Zhang.(2016).An accelerated test method of luminous flux depreciation for LED luminaires and lamps.reliability engineering and system safety,147,84-92.
MLA C. Qian,et al."An accelerated test method of luminous flux depreciation for LED luminaires and lamps".reliability engineering and system safety 147(2016):84-92.

入库方式: OAI收割

来源:半导体研究所

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