PoF-Simulation-Assisted Reliability Prediction for Electrolytic Capacitor in LED Drivers
文献类型:期刊论文
作者 | Bo Sun ; Xuejun Fan ; Cheng Qian ; Guoqi Zhang |
刊名 | ieee transactions on industrial electronics |
出版日期 | 2016 |
卷号 | 63期号:11页码:6726-6735 |
学科主题 | 半导体器件 |
收录类别 | SCI |
公开日期 | 2017-03-16 |
源URL | [http://ir.semi.ac.cn/handle/172111/28114] |
专题 | 半导体研究所_中科院半导体照明研发中心 |
推荐引用方式 GB/T 7714 | Bo Sun,Xuejun Fan,Cheng Qian,et al. PoF-Simulation-Assisted Reliability Prediction for Electrolytic Capacitor in LED Drivers[J]. ieee transactions on industrial electronics,2016,63(11):6726-6735. |
APA | Bo Sun,Xuejun Fan,Cheng Qian,&Guoqi Zhang.(2016).PoF-Simulation-Assisted Reliability Prediction for Electrolytic Capacitor in LED Drivers.ieee transactions on industrial electronics,63(11),6726-6735. |
MLA | Bo Sun,et al."PoF-Simulation-Assisted Reliability Prediction for Electrolytic Capacitor in LED Drivers".ieee transactions on industrial electronics 63.11(2016):6726-6735. |
入库方式: OAI收割
来源:半导体研究所
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