中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
PoF-Simulation-Assisted Reliability Prediction for Electrolytic Capacitor in LED Drivers

文献类型:期刊论文

作者Bo Sun ; Xuejun Fan ; Cheng Qian ; Guoqi Zhang
刊名ieee transactions on industrial electronics
出版日期2016
卷号63期号:11页码:6726-6735
学科主题半导体器件
收录类别SCI
公开日期2017-03-16
源URL[http://ir.semi.ac.cn/handle/172111/28114]  
专题半导体研究所_中科院半导体照明研发中心
推荐引用方式
GB/T 7714
Bo Sun,Xuejun Fan,Cheng Qian,et al. PoF-Simulation-Assisted Reliability Prediction for Electrolytic Capacitor in LED Drivers[J]. ieee transactions on industrial electronics,2016,63(11):6726-6735.
APA Bo Sun,Xuejun Fan,Cheng Qian,&Guoqi Zhang.(2016).PoF-Simulation-Assisted Reliability Prediction for Electrolytic Capacitor in LED Drivers.ieee transactions on industrial electronics,63(11),6726-6735.
MLA Bo Sun,et al."PoF-Simulation-Assisted Reliability Prediction for Electrolytic Capacitor in LED Drivers".ieee transactions on industrial electronics 63.11(2016):6726-6735.

入库方式: OAI收割

来源:半导体研究所

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