Preface of 16th International conference on Defects, Recognition, Imaging and Physics in Semiconductors
文献类型：期刊论文
| 作者 | Yang, Deren; Xu, Ke(徐科) |
| 刊名 | SUPERLATTICES AND MICROSTRUCTURES
 |
| 出版日期 | 2016 |
| 卷号 | 99 |
| 通讯作者 | Yang, DR |
| 收录类别 | SCI ; EI |
| 语种 | 英语 |
| WOS记录号 | WOS:000390630200001 |
| 源URL | [http://ir.sinano.ac.cn/handle/332007/4605]  |
| 专题 | 苏州纳米技术与纳米仿生研究所_测试分析平台 |
| 推荐引用方式 GB/T 7714 | Yang, Deren,Xu, Ke. Preface of 16th International conference on Defects, Recognition, Imaging and Physics in Semiconductors[J]. SUPERLATTICES AND MICROSTRUCTURES,2016,99. |
| APA | Yang, Deren,&Xu, Ke.(2016).Preface of 16th International conference on Defects, Recognition, Imaging and Physics in Semiconductors.SUPERLATTICES AND MICROSTRUCTURES,99. |
| MLA | Yang, Deren,et al."Preface of 16th International conference on Defects, Recognition, Imaging and Physics in Semiconductors".SUPERLATTICES AND MICROSTRUCTURES 99(2016). |
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