中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
AlN thin film grown on different substrates by hydride vapor phase epitaxy

文献类型:期刊论文

作者Sun, MS(孙茂松); Zhang, JC(张纪才); Huang, J(黄俊); Wang, JF(王建峰); Xu, K(徐科)
刊名JOURNAL OF CRYSTAL GROWTH
出版日期2016
卷号436
通讯作者Zhang, JC(张纪才)
英文摘要AlN thin films have been grown on GaN/sapphire templates, 6 H-SiC and sapphire by hydride vapor phase epitaxy. The influence of growth conditions and substrates on the crystal qualities and growth mode has been investigated by X-ray diffraction (XRD) and atomic force microscopy (AFM). The results showed that the low pressure was favorable for high-quality AlN thin film growth around 1000 degrees C. The full-width at half-maximum (FWHM) of (0002) XRD of 200-nm AlN thin film grown on GaN/sapphire, 6 H-SiC and sapphire are 220,187 and 260 arc s, respectively. While the corresponding counterparts of (1012) are 1300, 662 and 2650 arc s, respectively. Both suggested that low dislocation density in AlN grown on 6 H-SiC. The morphology of AlN thin film on sapphire showed islands without coalescence initially, and then changed to be coalescent with atomic steps at 1200 nm. However, those for samples on 6 H-SiC and GaN/sapphire showed smooth surface with clear atomic steps at thickness of 200 nm. The result indicated different growth modes of AlN on different substrates. It was believed that the different lattice mismatchs between AlN and substrates led to the different crystal qualities and growth modes. (C) 2015 Elsevier B.V. All rights reserved.
关键词[WOS]ALUMINUM NITRIDE ; LPE GROWTH ; HVPE ; TEMPLATE ; LAYERS ; TEMPERATURE ; SUBLIMATION ; PRESSURE ; CRYSTALS ; NITROGEN
收录类别SCI
语种英语
WOS记录号WOS:000368244600010
源URL[http://ir.sinano.ac.cn/handle/332007/4715]  
专题苏州纳米技术与纳米仿生研究所_测试分析平台
推荐引用方式
GB/T 7714
Sun, MS,Zhang, JC,Huang, J,et al. AlN thin film grown on different substrates by hydride vapor phase epitaxy[J]. JOURNAL OF CRYSTAL GROWTH,2016,436.
APA Sun, MS,Zhang, JC,Huang, J,Wang, JF,&Xu, K.(2016).AlN thin film grown on different substrates by hydride vapor phase epitaxy.JOURNAL OF CRYSTAL GROWTH,436.
MLA Sun, MS,et al."AlN thin film grown on different substrates by hydride vapor phase epitaxy".JOURNAL OF CRYSTAL GROWTH 436(2016).

入库方式: OAI收割

来源:苏州纳米技术与纳米仿生研究所

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