AlN thin film grown on different substrates by hydride vapor phase epitaxy
文献类型:期刊论文
作者 | Sun, MS(孙茂松); Zhang, JC(张纪才); Huang, J(黄俊); Wang, JF(王建峰); Xu, K(徐科) |
刊名 | JOURNAL OF CRYSTAL GROWTH
![]() |
出版日期 | 2016 |
卷号 | 436 |
通讯作者 | Zhang, JC(张纪才) |
英文摘要 | AlN thin films have been grown on GaN/sapphire templates, 6 H-SiC and sapphire by hydride vapor phase epitaxy. The influence of growth conditions and substrates on the crystal qualities and growth mode has been investigated by X-ray diffraction (XRD) and atomic force microscopy (AFM). The results showed that the low pressure was favorable for high-quality AlN thin film growth around 1000 degrees C. The full-width at half-maximum (FWHM) of (0002) XRD of 200-nm AlN thin film grown on GaN/sapphire, 6 H-SiC and sapphire are 220,187 and 260 arc s, respectively. While the corresponding counterparts of (1012) are 1300, 662 and 2650 arc s, respectively. Both suggested that low dislocation density in AlN grown on 6 H-SiC. The morphology of AlN thin film on sapphire showed islands without coalescence initially, and then changed to be coalescent with atomic steps at 1200 nm. However, those for samples on 6 H-SiC and GaN/sapphire showed smooth surface with clear atomic steps at thickness of 200 nm. The result indicated different growth modes of AlN on different substrates. It was believed that the different lattice mismatchs between AlN and substrates led to the different crystal qualities and growth modes. (C) 2015 Elsevier B.V. All rights reserved. |
关键词[WOS] | ALUMINUM NITRIDE ; LPE GROWTH ; HVPE ; TEMPLATE ; LAYERS ; TEMPERATURE ; SUBLIMATION ; PRESSURE ; CRYSTALS ; NITROGEN |
收录类别 | SCI |
语种 | 英语 |
WOS记录号 | WOS:000368244600010 |
源URL | [http://ir.sinano.ac.cn/handle/332007/4715] ![]() |
专题 | 苏州纳米技术与纳米仿生研究所_测试分析平台 |
推荐引用方式 GB/T 7714 | Sun, MS,Zhang, JC,Huang, J,et al. AlN thin film grown on different substrates by hydride vapor phase epitaxy[J]. JOURNAL OF CRYSTAL GROWTH,2016,436. |
APA | Sun, MS,Zhang, JC,Huang, J,Wang, JF,&Xu, K.(2016).AlN thin film grown on different substrates by hydride vapor phase epitaxy.JOURNAL OF CRYSTAL GROWTH,436. |
MLA | Sun, MS,et al."AlN thin film grown on different substrates by hydride vapor phase epitaxy".JOURNAL OF CRYSTAL GROWTH 436(2016). |
入库方式: OAI收割
浏览0
下载0
收藏0
其他版本
除非特别说明,本系统中所有内容都受版权保护,并保留所有权利。