中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
Growth and characterization of VO2/p-GaN/sapphire heterostructure with phase transition properties

文献类型:期刊论文

作者Bian, Jiming1,2; Wang, Minhuan1; Miao, Lihua1; Li, Xiaoxuan1; Luo, Yingmin1; Zhang, Dong1,3; Zhang, Yuzhi2
刊名APPLIED SURFACE SCIENCE
出版日期2015-12-01
卷号357页码:282-286
关键词Vanadium oxide p-GaN Pulsed laser deposition Phase transition
英文摘要High quality pure phase VO2 films were deposited on p-GaN/sapphire substrates by pulsed laser deposition (PLD). A well-defined interface with dense and uniform morphology was observed in the as-grown VO2/p-GaN/sapphire heterostructure. The X-ray photoelectron spectroscopy (XPS) analyses confirmed the valence state of vanadium (V) in VO2 films was principally composed of V4+ with trace amount of V5+, no other valence state of V was detected. Meanwhile, a distinct reversible semiconductor-to-metal (SMT) phase transition with resistance change up to nearly three orders of magnitude was observed in the temperature dependent electrical resistance measurement, which was comparable to the high quality VO2 film grown directly on sapphire substrates. Our present findings will give a deeper insight into the physical mechanism behind the exotic characteristics of VO2/p-GaN heterostructure, and further motivate research in novel devices with combined functional properties of both correlated oxide and wide bandgap nitride semiconductors. (C) 2015 Elsevier B.V. All rights reserved.
WOS标题词Science & Technology ; Physical Sciences ; Technology
类目[WOS]Chemistry, Physical ; Materials Science, Coatings & Films ; Physics, Applied ; Physics, Condensed Matter
研究领域[WOS]Chemistry ; Materials Science ; Physics
关键词[WOS]METAL-INSULATOR-TRANSITION ; VANADIUM DIOXIDE ; OPTICAL-PROPERTIES ; FILMS ; XPS ; PLD
收录类别SCI
语种英语
WOS记录号WOS:000366216900037
源URL[http://ir.sic.ac.cn/handle/331005/23341]  
专题上海硅酸盐研究所_特种无机涂层重点实验室_期刊论文
作者单位1.Dalian Univ Technol, Sch Phys & Optoelect Technol, Key Lab Mat Modificat Laser Ion & Electron Beams, Minist Educ, Dalian 116024, Peoples R China
2.Chinese Acad Sci, Key Lab Inorgan Coating Mat, Shanghai 200050, Peoples R China
3.Shenyang Inst Engn, New Energy Source Res Ctr, Shenyang 110136, Peoples R China
推荐引用方式
GB/T 7714
Bian, Jiming,Wang, Minhuan,Miao, Lihua,et al. Growth and characterization of VO2/p-GaN/sapphire heterostructure with phase transition properties[J]. APPLIED SURFACE SCIENCE,2015,357:282-286.
APA Bian, Jiming.,Wang, Minhuan.,Miao, Lihua.,Li, Xiaoxuan.,Luo, Yingmin.,...&Zhang, Yuzhi.(2015).Growth and characterization of VO2/p-GaN/sapphire heterostructure with phase transition properties.APPLIED SURFACE SCIENCE,357,282-286.
MLA Bian, Jiming,et al."Growth and characterization of VO2/p-GaN/sapphire heterostructure with phase transition properties".APPLIED SURFACE SCIENCE 357(2015):282-286.

入库方式: OAI收割

来源:上海硅酸盐研究所

浏览0
下载0
收藏0
其他版本

除非特别说明,本系统中所有内容都受版权保护,并保留所有权利。