中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
Colossal permittivity and dielectric relaxation of (Li, In) Co-doped ZnO ceramics

文献类型:期刊论文

作者Huang, Dong1,2,3; Liu, Zhifu1; Li, Yongxiang1,2; Liu, Yun4
刊名JOURNAL OF ALLOYS AND COMPOUNDS
出版日期2017-03-25
卷号698页码:200-206
关键词Colossal permittivity Dielectric relaxation Co-doped ZnO Oxygen vacancy
英文摘要In this study, a colossal permittivity up to 3800 and a low dielectric loss of 0.11 at 1 kHz have been obtained from the (Li, In) co-doped ZnO ceramic [Zn(1-2x)(Li, In)(x)O] when x was 0.5%. Electric modulus spectroscopy and impedance analysis were used to investigate the origin of its high permittivity. Two relaxation peaks and a dielectric anomaly were observed in the temperature range of 293-363 K. According to the Debye relaxation theory, the low-and high-temperature relaxation peaks with activation energies of 0.09 eV and 0.29 eV, have been attributed to the hopping of singly and doubly charged oxygen vacancies, which are created by lithium and indium ions doping and oxygen deficiency during sintering process. After thermal treatment in an oxidizing atmosphere, the peaks related to the singly and doubly charged oxygen vacancies disappear and the permittivity reduces to similar to 460 at room-temperature. From the X-ray photoelectron spectra (XPS), the concentrations of oxygen vacancies decrease after the O-2-annealing process. The results reveal that the oxygen defects would be the main origin of the colossal permittivity of co-doped ZnO at room-temperature range. (C) 2016 Elsevier B.V. All rights reserved.
WOS标题词Science & Technology ; Physical Sciences ; Technology
类目[WOS]Chemistry, Physical ; Materials Science, Multidisciplinary ; Metallurgy & Metallurgical Engineering
研究领域[WOS]Chemistry ; Materials Science ; Metallurgy & Metallurgical Engineering
关键词[WOS]THIN-FILMS ; CONDUCTIVITY RELAXATION ; OXYGEN VACANCIES ; PHOTOLUMINESCENCE ; PERFORMANCE ; TRANSPORT ; BEHAVIOR
收录类别SCI
语种英语
WOS记录号WOS:000393586300029
源URL[http://ir.sic.ac.cn/handle/331005/23408]  
专题上海硅酸盐研究所_无机功能材料与器件重点实验室_期刊论文
作者单位1.Chinese Acad Sci, Shanghai Inst Ceram, CAS Key Lab Inorgan Funct Mat & Devices, Shanghai 200050, Peoples R China
2.ShanghaiTech Univ, Sch Phys Sci & Technol, Shanghai 201210, Peoples R China
3.Univ Hong Kong, Dept Phys, Hong Kong, Hong Kong, Peoples R China
4.Australian Natl Univ, Res Sch Chem, Canberra, ACT 2601, Australia
推荐引用方式
GB/T 7714
Huang, Dong,Liu, Zhifu,Li, Yongxiang,et al. Colossal permittivity and dielectric relaxation of (Li, In) Co-doped ZnO ceramics[J]. JOURNAL OF ALLOYS AND COMPOUNDS,2017,698:200-206.
APA Huang, Dong,Liu, Zhifu,Li, Yongxiang,&Liu, Yun.(2017).Colossal permittivity and dielectric relaxation of (Li, In) Co-doped ZnO ceramics.JOURNAL OF ALLOYS AND COMPOUNDS,698,200-206.
MLA Huang, Dong,et al."Colossal permittivity and dielectric relaxation of (Li, In) Co-doped ZnO ceramics".JOURNAL OF ALLOYS AND COMPOUNDS 698(2017):200-206.

入库方式: OAI收割

来源:上海硅酸盐研究所

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