中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
Modal phase measuring deflectometry

文献类型:期刊论文

作者Huang, L; Xue, JP; Gao, B; McPherson, C; Beverage, J; Idir, M
刊名OPTICS EXPRESS
出版日期2016
卷号24期号:21页码:24649-24664
ISSN号1094-4087
通讯作者Huang, L (reprint author), Brookhaven Natl Lab, NSLS II, 50 Rutherford Dr, Upton, NY 11973 USA.
英文摘要In this work, a model based method is applied to phase measuring deflectometry, named modal phase measuring deflectometry. The height and slopes of the surface under test are represented by mathematical models and updated by optimizing the model coefficients to minimize the discrepancy between the reprojection in ray tracing and the actual measurement. The pose of the screen relative to the camera is pre-calibrated and further optimized together with the shape coefficients of the surface under test. Simulations and experiments are conducted to demonstrate the feasibility of the proposed approach. (C) 2016 Optical Society of America
收录类别SCI
语种英语
WOS记录号WOS:000388399100090
源URL[http://ir.sinap.ac.cn/handle/331007/26576]  
专题上海应用物理研究所_中科院上海应用物理研究所2011-2017年
推荐引用方式
GB/T 7714
Huang, L,Xue, JP,Gao, B,et al. Modal phase measuring deflectometry[J]. OPTICS EXPRESS,2016,24(21):24649-24664.
APA Huang, L,Xue, JP,Gao, B,McPherson, C,Beverage, J,&Idir, M.(2016).Modal phase measuring deflectometry.OPTICS EXPRESS,24(21),24649-24664.
MLA Huang, L,et al."Modal phase measuring deflectometry".OPTICS EXPRESS 24.21(2016):24649-24664.

入库方式: OAI收割

来源:上海应用物理研究所

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