On the coiflet-TDS solution for scattering by sharp coated cones and its application to emissivity determination
文献类型：期刊论文
| 作者 | Jin, Ming1; Bai, Ming1; Zhang, Lisha1; Pan, Guangwen1; Miao, Jungang1 |
| 刊名 | IEEE Transactions on Geoscience and Remote Sensing
 |
| 出版日期 | 2016 |
| 卷号 | 54期号:3页码:1399-1409 |
| 关键词 | APERTURE RADAR INTERFEROMETRY SAR INTERFEROMETRY DEFORMATION SUBSIDENCE EARTHQUAKE JERS-1 |
| 英文摘要 | We report the continuous effects in modeling sharp coated cones as calibration targets by surface integration solutions. The Coiflet based method of moment (MoM) is employed in conjunction with the thin dielectric sheet approximation (TDS). The Coifman wavelets inherit mathematical superiority in the Galerkin procedure, e.g., the high precision one-point quadrature for fast matrix filling, local multi-resolution ability, and high regularity with Hölder index 1.449 in smoothness. Local geometry refinements are implemented to reduce the errors by TDS approximation in modeling very sharp structures. The Coiflet-TDS solution is compared to an in-house FDTD package and good agreement has been observed. The presented MoM is also compared against the RWG-TDS based commercial software FEKO, and the Coiflet-TDS demonstrates more robust in modeling surfaces with sharp geometries. Finally, the emissivity of a calibrator is studied versus directions and polarizations, and its variation trends are observed. © 1980-2012 IEEE. |
| 学科主题 | Geochemistry & Geophysics; Engineering; Remote Sensing; Imaging Science & Photographic Technology |
| 类目[WOS] | Geochemistry & Geophysics ; Engineering, Electrical & Electronic ; Remote Sensing ; Imaging Science & Photographic Technology |
| 收录类别 | SCI ; EI |
| 语种 | 英语 |
| WOS记录号 | WOS:20154201386133 |
| 源URL | [http://ir.radi.ac.cn/handle/183411/39191]  |
| 专题 | 遥感与数字地球研究所_SCI/EI期刊论文_期刊论文 |
| 作者单位 | 1. State Key Laboratory of Remote Sensing Science, Institute of Remote Sensing, Digital Earth Chinese Academy of Sciences (CAS), Beijing, China 2. School of Electronic Information Engineering (EIE), Beihang University, Beijing, China 3. Electrical Engineering Department, Arizona State University, Tempe 4.AZ, United States |
| 推荐引用方式 GB/T 7714 | Jin, Ming,Bai, Ming,Zhang, Lisha,et al. On the coiflet-TDS solution for scattering by sharp coated cones and its application to emissivity determination[J]. IEEE Transactions on Geoscience and Remote Sensing,2016,54(3):1399-1409. |
| APA | Jin, Ming,Bai, Ming,Zhang, Lisha,Pan, Guangwen,&Miao, Jungang.(2016).On the coiflet-TDS solution for scattering by sharp coated cones and its application to emissivity determination.IEEE Transactions on Geoscience and Remote Sensing,54(3),1399-1409. |
| MLA | Jin, Ming,et al."On the coiflet-TDS solution for scattering by sharp coated cones and its application to emissivity determination".IEEE Transactions on Geoscience and Remote Sensing 54.3(2016):1399-1409. |
入库方式： OAI收割
来源：遥感与数字地球研究所
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