中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
CBED Tools for semi-automatic measurement of crystal thicknesses

文献类型:期刊论文

作者Shi Honglong1; Luo Minting2; Wang Wenzhong1
刊名JOURNAL OF APPLIED CRYSTALLOGRAPHY
出版日期2017-02-01
卷号50页码:313-319
关键词Convergent-beam Electron Diffraction Thickness Measurement Kossel-mollenstedt Fringes Electron Diffraction Computer Programs
ISSN号1600-5767
DOI10.1107/S1600576716019476
文献子类Article
英文摘要

Convergent-beam electron diffraction (CBED) is one of the most popular techniques to measure crystal thickness. The traditional measurement involves linear fitting of several fringes across the CBED disc, but for a thin crystal with fewer than three fringes the usefulness of this method will be limited. CBED Tools, a free plugin for the DigitalMicrograph software, provides a fast (similar to 12 min) and accurate algorithm to measure the crystal thickness on the basis of the linear fitting method, but it is also capable of determining the crystal thickness when it is very thin and only one fringe or part of the first fringe is recorded. CBED Tools can also be utilized to handle the severely distorted CBED pattern obtained when the zero-order Laue zone Kikuchi lines overlap with the fringes.

WOS关键词Electron-diffraction ; Pattern ; Films
WOS研究方向Chemistry ; Crystallography
语种英语
WOS记录号WOS:000394289400031
资助机构985 project(98507010009) ; '211 project' of the Ministry of Education of China ; National Natural Science Foundation of China(11604394) ; Beijing Higher Education Young Elite Teacher Project(YETP1297) ; Undergraduate Research and Innovative Undertaking Programme of Beijing(BEIJ2016110008 ; BEIJ2015110022)
源URL[http://ir.ipe.ac.cn/handle/122111/21947]  
专题过程工程研究所_湿法冶金清洁生产技术国家工程实验室
作者单位1.Minzu Univ, Sch Sci, 27 Zhong Guancun South Ave, Beijing 100081, Peoples R China
2.Chinese Acad Sci, Inst Proc Engn, Natl Engn Lab Hydromet Cleaner Prod Technol, Beijing, Peoples R China
推荐引用方式
GB/T 7714
Shi Honglong,Luo Minting,Wang Wenzhong. CBED Tools for semi-automatic measurement of crystal thicknesses[J]. JOURNAL OF APPLIED CRYSTALLOGRAPHY,2017,50:313-319.
APA Shi Honglong,Luo Minting,&Wang Wenzhong.(2017).CBED Tools for semi-automatic measurement of crystal thicknesses.JOURNAL OF APPLIED CRYSTALLOGRAPHY,50,313-319.
MLA Shi Honglong,et al."CBED Tools for semi-automatic measurement of crystal thicknesses".JOURNAL OF APPLIED CRYSTALLOGRAPHY 50(2017):313-319.

入库方式: OAI收割

来源:过程工程研究所

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