CBED Tools for semi-automatic measurement of crystal thicknesses
文献类型:期刊论文
作者 | Shi Honglong1; Luo Minting2; Wang Wenzhong1 |
刊名 | JOURNAL OF APPLIED CRYSTALLOGRAPHY
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出版日期 | 2017-02-01 |
卷号 | 50页码:313-319 |
关键词 | Convergent-beam Electron Diffraction Thickness Measurement Kossel-mollenstedt Fringes Electron Diffraction Computer Programs |
ISSN号 | 1600-5767 |
DOI | 10.1107/S1600576716019476 |
文献子类 | Article |
英文摘要 | Convergent-beam electron diffraction (CBED) is one of the most popular techniques to measure crystal thickness. The traditional measurement involves linear fitting of several fringes across the CBED disc, but for a thin crystal with fewer than three fringes the usefulness of this method will be limited. CBED Tools, a free plugin for the DigitalMicrograph software, provides a fast (similar to 12 min) and accurate algorithm to measure the crystal thickness on the basis of the linear fitting method, but it is also capable of determining the crystal thickness when it is very thin and only one fringe or part of the first fringe is recorded. CBED Tools can also be utilized to handle the severely distorted CBED pattern obtained when the zero-order Laue zone Kikuchi lines overlap with the fringes. |
WOS关键词 | Electron-diffraction ; Pattern ; Films |
WOS研究方向 | Chemistry ; Crystallography |
语种 | 英语 |
WOS记录号 | WOS:000394289400031 |
资助机构 | 985 project(98507010009) ; '211 project' of the Ministry of Education of China ; National Natural Science Foundation of China(11604394) ; Beijing Higher Education Young Elite Teacher Project(YETP1297) ; Undergraduate Research and Innovative Undertaking Programme of Beijing(BEIJ2016110008 ; BEIJ2015110022) |
源URL | [http://ir.ipe.ac.cn/handle/122111/21947] ![]() |
专题 | 过程工程研究所_湿法冶金清洁生产技术国家工程实验室 |
作者单位 | 1.Minzu Univ, Sch Sci, 27 Zhong Guancun South Ave, Beijing 100081, Peoples R China 2.Chinese Acad Sci, Inst Proc Engn, Natl Engn Lab Hydromet Cleaner Prod Technol, Beijing, Peoples R China |
推荐引用方式 GB/T 7714 | Shi Honglong,Luo Minting,Wang Wenzhong. CBED Tools for semi-automatic measurement of crystal thicknesses[J]. JOURNAL OF APPLIED CRYSTALLOGRAPHY,2017,50:313-319. |
APA | Shi Honglong,Luo Minting,&Wang Wenzhong.(2017).CBED Tools for semi-automatic measurement of crystal thicknesses.JOURNAL OF APPLIED CRYSTALLOGRAPHY,50,313-319. |
MLA | Shi Honglong,et al."CBED Tools for semi-automatic measurement of crystal thicknesses".JOURNAL OF APPLIED CRYSTALLOGRAPHY 50(2017):313-319. |
入库方式: OAI收割
来源:过程工程研究所
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