Hysteresis effect in adhesive elastic contact
文献类型：会议论文
| 作者 | Wei Z(魏征); Zhao YP(赵亚溥)
|
| 出版日期 | 2003 |
| 会议名称 | 2003 ASME Design Engineering Technical Conferences and Computers and Information in Engineering Conference |
| 会议日期 | September 2, 2003 - September 6, 2003 |
| 会议地点 | Chicago, IL, United states |
| 关键词 | Scanning probe microscope (SPM) Transition parameter |
| 中文摘要 | Adhesive forces in microscale or nanoscale contact play a significant role in microelectromechanical systems (MEMS); scanning probe microscope (SPM) and some other related fields. In this paper, the relationship between the pull-off force and the transition parameter as well as the variation of the pull-off radius with the transition parameter is given. When hysteresis effect is considered, hysteresis models are presented to describe the contact radius as a function of external load in loading and unloading processes. Among these models, we verified the hysteresis model from JKR, which is in a good agreement with experiment. The parameter α of dissipated elastic energy can be measured through experiment. |
| 收录类别 | EI |
| 会议录 | Proceedings of the ASME Design Engineering Technical Conference
 |
| 语种 | 英语 |
| 源URL | [http://dspace.imech.ac.cn/handle/311007/60268]  |
| 专题 | 力学研究所_力学所知识产出(1956-2008) |
| 推荐引用方式 GB/T 7714 | Wei Z,Zhao YP. Hysteresis effect in adhesive elastic contact[C]. 见:2003 ASME Design Engineering Technical Conferences and Computers and Information in Engineering Conference. Chicago, IL, United states. September 2, 2003 - September 6, 2003. |
入库方式： OAI收割
来源：力学研究所
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