中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
Soft X-ray spectroscopy of highly charged silicon ions in dense plasmas

文献类型:期刊论文

作者Liang, G. Y.1; Zhao, G.1; Zhong, J. Y.1; Li, Y. T.2; Liu, Y. Q.2; Dong, Q. L.2; Yuan, X. H.2; Jin, Z.2; Zhang, J.2
刊名ASTROPHYSICAL JOURNAL SUPPLEMENT SERIES
出版日期2008-07-01
卷号177期号:1页码:326-334
关键词line : identification methods : analytical methods : laboratory stars : coronae stars : individual (Procyon)
英文摘要Rich soft X-ray emission lines of highly charged silicon ions (Si vi-Si XII) were observed by irradiating an ultraintense laser pulse with width of 200 fs and energy of similar to 90 mJ on the solid silicon target. The high-resolution spectra of highly charged silicon ions with full width at half-maximum (FWHM) of similar to 0.3Y0.4 angstrom is analyzed in the wavelength range of 40-90 angstrom. The wavelengths of 53 prominent lines are determined with statistical uncertainties of up to 0.005 angstrom. Collisional-radiative models were constructed for Si VI-Si XII ions, which satisfactorily reproduce the experimental spectra and help in the line identification. Calculations at different electron densities reveal that the spectra of dense plasmas are more complicated than the spectra of thin plasmas. A comparison with the Kelly database reveals a good agreement for most peak intensities and differences for a few emission lines.
收录类别SCI
语种英语
WOS记录号WOS:000257672300014
源URL[http://ir.bao.ac.cn/handle/114a11/7461]  
专题国家天文台_光学天文研究部
作者单位1.Chinese Acad Sci, Natl Astron Observ, Beijing 100012, Peoples R China
2.Chinese Acad Sci, Inst Phys, Beijing 100080, Peoples R China
推荐引用方式
GB/T 7714
Liang, G. Y.,Zhao, G.,Zhong, J. Y.,et al. Soft X-ray spectroscopy of highly charged silicon ions in dense plasmas[J]. ASTROPHYSICAL JOURNAL SUPPLEMENT SERIES,2008,177(1):326-334.
APA Liang, G. Y..,Zhao, G..,Zhong, J. Y..,Li, Y. T..,Liu, Y. Q..,...&Zhang, J..(2008).Soft X-ray spectroscopy of highly charged silicon ions in dense plasmas.ASTROPHYSICAL JOURNAL SUPPLEMENT SERIES,177(1),326-334.
MLA Liang, G. Y.,et al."Soft X-ray spectroscopy of highly charged silicon ions in dense plasmas".ASTROPHYSICAL JOURNAL SUPPLEMENT SERIES 177.1(2008):326-334.

入库方式: OAI收割

来源:国家天文台

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