Soft X-ray spectroscopy of highly charged silicon ions in dense plasmas
文献类型：期刊论文
| 作者 | Liang, G. Y.1; Zhao, G.1 ; Zhong, J. Y.1; Li, Y. T.2; Liu, Y. Q.2; Dong, Q. L.2; Yuan, X. H.2; Jin, Z.2; Zhang, J.2
|
| 刊名 | ASTROPHYSICAL JOURNAL SUPPLEMENT SERIES
 |
| 出版日期 | 2008-07-01 |
| 卷号 | 177期号:1页码:326-334 |
| 关键词 | line : identification methods : analytical methods : laboratory stars : coronae stars : individual (Procyon) |
| 英文摘要 | Rich soft X-ray emission lines of highly charged silicon ions (Si vi-Si XII) were observed by irradiating an ultraintense laser pulse with width of 200 fs and energy of similar to 90 mJ on the solid silicon target. The high-resolution spectra of highly charged silicon ions with full width at half-maximum (FWHM) of similar to 0.3Y0.4 angstrom is analyzed in the wavelength range of 40-90 angstrom. The wavelengths of 53 prominent lines are determined with statistical uncertainties of up to 0.005 angstrom. Collisional-radiative models were constructed for Si VI-Si XII ions, which satisfactorily reproduce the experimental spectra and help in the line identification. Calculations at different electron densities reveal that the spectra of dense plasmas are more complicated than the spectra of thin plasmas. A comparison with the Kelly database reveals a good agreement for most peak intensities and differences for a few emission lines. |
| 收录类别 | SCI |
| 语种 | 英语 |
| WOS记录号 | WOS:000257672300014 |
| 源URL | [http://ir.bao.ac.cn/handle/114a11/7461]  |
| 专题 | 国家天文台_光学天文研究部 |
| 作者单位 | 1.Chinese Acad Sci, Natl Astron Observ, Beijing 100012, Peoples R China 2.Chinese Acad Sci, Inst Phys, Beijing 100080, Peoples R China |
| 推荐引用方式 GB/T 7714 | Liang, G. Y.,Zhao, G.,Zhong, J. Y.,et al. Soft X-ray spectroscopy of highly charged silicon ions in dense plasmas[J]. ASTROPHYSICAL JOURNAL SUPPLEMENT SERIES,2008,177(1):326-334. |
| APA | Liang, G. Y..,Zhao, G..,Zhong, J. Y..,Li, Y. T..,Liu, Y. Q..,...&Zhang, J..(2008).Soft X-ray spectroscopy of highly charged silicon ions in dense plasmas.ASTROPHYSICAL JOURNAL SUPPLEMENT SERIES,177(1),326-334. |
| MLA | Liang, G. Y.,et al."Soft X-ray spectroscopy of highly charged silicon ions in dense plasmas".ASTROPHYSICAL JOURNAL SUPPLEMENT SERIES 177.1(2008):326-334. |
入库方式： OAI收割
来源：国家天文台
浏览0
下载0
收藏0
其他版本
除非特别说明，本系统中所有内容都受版权保护，并保留所有权利。