中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
Defect analysis in Czochralski-grown Yb : FAP crystal

文献类型:期刊论文

作者Song PX ; Zhao ZW ; Xu XD(徐晓东) ; Deng PZ(邓佩珍) ; Xu J(徐军)
刊名j. cryst. growth
出版日期2006
卷号286期号:2页码:498
关键词defects dislocations Yb : FAP crystal
ISSN号0022-0248
中文摘要growth-induced defects in yb:fap crystals grown by the czochralski method have been investigated by optical microscopy, chemical etching, scanning electron microscopy (sem) and energy-dispersive spectroscopy (eds). anisotropic etching features have been observed on two fap crystal planes: (0001) and (1010). the shape of etch pits on the (0001) plane is hexagonal, while the etch pits on the (1010) plane have a variety of irregular shapes. it is also found that the density of etch pit varies along the boule. based on the experimental observations, the formation mechanisnis of growth defects are discussed, and methods for reducing the growth-induced defect concentration is proposed. (c) 2005 elsevier b.v. all rights reserved.
学科主题光学材料;晶体
收录类别EI
语种英语
WOS记录号WOS:000234758300045
公开日期2009-09-24
源URL[http://ir.siom.ac.cn/handle/181231/5725]  
专题上海光学精密机械研究所_激光与光电子功能材料研发中心
推荐引用方式
GB/T 7714
Song PX,Zhao ZW,Xu XD,et al. Defect analysis in Czochralski-grown Yb : FAP crystal[J]. j. cryst. growth,2006,286(2):498, 501.
APA Song PX,Zhao ZW,徐晓东,邓佩珍,&徐军.(2006).Defect analysis in Czochralski-grown Yb : FAP crystal.j. cryst. growth,286(2),498.
MLA Song PX,et al."Defect analysis in Czochralski-grown Yb : FAP crystal".j. cryst. growth 286.2(2006):498.

入库方式: OAI收割

来源:上海光学精密机械研究所

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