Precise determination of anomalous scattering factors of Ge by using X-ray resonant scattering
文献类型：期刊论文
| 作者 | Yoshizawa Masami ; Zhou SM(周圣明) ; Negishi Riichirou ; Fukamachi Tomoe ; Kawamura Takaaki |
| 刊名 | acta crystallogr. sect. a
 |
| 出版日期 | 2008 |
| 卷号 | 64页码:321 |
| 关键词 | LATTICE DISTORTION TOPOGRAPHY |
| ISSN号 | 0108-7673 |
| 中文摘要 | variations of peak position of the rocking curve in the bragg case are measured from a ge thin crystal near the k-absorption edge. the variations are caused by a phase change of the real part of the atomic scattering factor. based on the measurement, the values of the real part are determined with an accuracy of better than 1%. the values are the most reliable ones among those reported values so far as they are directly determined from the normal atomic scattering factors. |
| 学科主题 | 光学材料;晶体 |
| 语种 | 英语 |
| WOS记录号 | WOS:000253244000007 |
| 公开日期 | 2009-09-24 |
| 源URL | [http://ir.siom.ac.cn/handle/181231/6051]  |
| 专题 | 上海光学精密机械研究所_激光与光电子功能材料研发中心 |
| 推荐引用方式 GB/T 7714 | Yoshizawa Masami,Zhou SM,Negishi Riichirou,et al. Precise determination of anomalous scattering factors of Ge by using X-ray resonant scattering[J]. acta crystallogr. sect. a,2008,64:321, 325. |
| APA | Yoshizawa Masami,周圣明,Negishi Riichirou,Fukamachi Tomoe,&Kawamura Takaaki.(2008).Precise determination of anomalous scattering factors of Ge by using X-ray resonant scattering.acta crystallogr. sect. a,64,321. |
| MLA | Yoshizawa Masami,et al."Precise determination of anomalous scattering factors of Ge by using X-ray resonant scattering".acta crystallogr. sect. a 64(2008):321. |
入库方式： OAI收割
来源：上海光学精密机械研究所
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