Characterization of m-plane ZnO thin film on gamma-LiAlO2 (100) substrate by metal-organic chemical vapor deposition
文献类型:期刊论文
作者 | Lin Hui ; Zhou SM(周圣明) ; Huang Taohua ; Teng Hao ; Liu Xuedong ; Gu Shulin ; Zhu Shunming ; Xie Zili ; Han Ping ; Zhang Rong |
刊名 | j. alloy. compd.
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出版日期 | 2009 |
卷号 | 467期号:1-2页码:l8 |
关键词 | Semiconductors X-ray diffraction Anisotropy |
ISSN号 | 0925-8388 |
中文摘要 | non-polar (1 (1) over bar 00)m-plane zno thin film has been prepared on gamma-lialo2 (100)substrate via the low pressure metal organic chemical vapor deposition. obvious intensity variation of the e-2 mode in the polarized raman spectra and the absorption edge shift in the polarized optical transmission spectra indicate that the m-plane film exhibits optical anisotropy, which have applications in certain optical devices, such as the uv modulator and polarization-dependent beam switch. from the atomic force microscopy images, highly-oriented uniform-sized grains of rectangular shape were observed. (c) 2008 elsevier b.v. all rights reserved. |
资助信息 | national natural science foundation of china [60676004]; shanghai science program [06dz11402]; high technology research and development of china [2006aa03a101, 2006aa03a103] |
语种 | 英语 |
WOS记录号 | WOS:000262412000002 |
公开日期 | 2009-09-24 |
源URL | [http://ir.siom.ac.cn/handle/181231/6195] ![]() |
专题 | 上海光学精密机械研究所_激光与光电子功能材料研发中心 |
推荐引用方式 GB/T 7714 | Lin Hui,Zhou SM,Huang Taohua,et al. Characterization of m-plane ZnO thin film on gamma-LiAlO2 (100) substrate by metal-organic chemical vapor deposition[J]. j. alloy. compd.,2009,467(1-2):l8, l10. |
APA | Lin Hui.,周圣明.,Huang Taohua.,Teng Hao.,Liu Xuedong.,...&Zhang Rong.(2009).Characterization of m-plane ZnO thin film on gamma-LiAlO2 (100) substrate by metal-organic chemical vapor deposition.j. alloy. compd.,467(1-2),l8. |
MLA | Lin Hui,et al."Characterization of m-plane ZnO thin film on gamma-LiAlO2 (100) substrate by metal-organic chemical vapor deposition".j. alloy. compd. 467.1-2(2009):l8. |
入库方式: OAI收割
来源:上海光学精密机械研究所
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