中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
Analysis of electromagnetic propagation in birefringent thin film

文献类型:期刊论文

作者Qi HJ(齐红基) ; Wang JG ; Shao JD(邵建达) ; Fan ZX(范正修)
刊名sci. china ser. g-phys. mech. astron.
出版日期2005
卷号48期号:5页码:513
关键词birefringent thin film interface homolateral refraction behavior wide-angle Brewster's phenomenon
ISSN号1672-1799
中文摘要in general, the propagating behavior of extraordinary wave in anisotropic materials is different from that in isotropic materials. with the tangential continuity of maxwell's equations, the electromagnetic propagating behaviors have been investigated at the incident and exit interfaces of the uniaxial anisotropic thin film. the emphasis was placed on two interesting optical phenomena such as homolateral refraction behavior and wide-angle brewster's phenomenon, which occurred at the interfaces of uniaxial anisotropic thin film.
学科主题光学薄膜
收录类别EI
语种英语
WOS记录号WOS:000233704800001
公开日期2009-09-22
源URL[http://ir.siom.ac.cn/handle/181231/4118]  
专题上海光学精密机械研究所_光学薄膜技术研究与发展中心
推荐引用方式
GB/T 7714
Qi HJ,Wang JG,Shao JD,et al. Analysis of electromagnetic propagation in birefringent thin film[J]. sci. china ser. g-phys. mech. astron.,2005,48(5):513, 520.
APA 齐红基,Wang JG,邵建达,&范正修.(2005).Analysis of electromagnetic propagation in birefringent thin film.sci. china ser. g-phys. mech. astron.,48(5),513.
MLA 齐红基,et al."Analysis of electromagnetic propagation in birefringent thin film".sci. china ser. g-phys. mech. astron. 48.5(2005):513.

入库方式: OAI收割

来源:上海光学精密机械研究所

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