中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
微缺陷对薄膜滤光片环境稳定性的影响

文献类型:期刊论文

;
作者张东平 ; 齐红基 ; 方明 ; 邵建达 ; 范瑞瑛 ; 范正修
刊名光子学报
出版日期2005
卷号34期号:6页码:873
关键词薄膜滤光片 Thin film filters 微缺陷 Microdefect 环境稳定性 Environment stability
ISSN号1004-4213
其他题名Influence of the microdefect on the environment stability of thin film Filters
中文摘要用热蒸发方法沉积了薄膜滤光片.并将样品分别在去离子水中浸泡10天和30天.通过分光光度计、光学暗场显微镜、及扫描电子显微镜等多种测试手段,对诱导透射滤光片在潮湿环境下的稳定性进行了研究.实验发现,在潮湿环境下滤光片产生的膜层分离都是从薄膜中微缺陷点处开始发生和发展的,微缺陷是影响滤光片环境稳定性的重要原因之一,其中杂质和针孔是滤光片中两种最常见的微缺陷.EDS能谱分析进一步表明,薄膜中杂质缺陷成分即为Al2O3膜料本身,所以不能推测,薄膜沉积中的喷溅可能是微缺陷产生的根本原因,抑制喷溅可以有效提高薄膜滤光; Thin film filters were prepared by evaporation method, and the samples were soaked in DI-water for 10 days and 30 days respectively. By using spectral photometer, dark field microscope, and scanning electron microscope, stability of induced transmission filters in moisture environment was studied. The experiment results show that the layers delaminations of filters often initiate and expand from microdefect sites in the films in moisture environment. Microdefect in thin films is one of the most important influence factors on the filters environment stability, and impurity and pinhole are two main sorts of defects in thin film filters. EDS energy spectra analysis indicates that component of the impurity is Al_2O_3 coating material itself. So it is reasonable to deduce that the sputtering in film position process may be the original reasons for the defects generation, and sputtering restraining is a useful method to improve the stability of the optical filters. At last, the diffusion theory was used to analysis the ......
学科主题光学薄膜
分类号O484.5
收录类别ei
语种中文
公开日期2009-09-22
源URL[http://ir.siom.ac.cn/handle/181231/4168]  
专题上海光学精密机械研究所_光学薄膜技术研究与发展中心
推荐引用方式
GB/T 7714
张东平,齐红基,方明,等. 微缺陷对薄膜滤光片环境稳定性的影响, Influence of the microdefect on the environment stability of thin film Filters[J]. 光子学报,2005,34(6):873, 876.
APA 张东平,齐红基,方明,邵建达,范瑞瑛,&范正修.(2005).微缺陷对薄膜滤光片环境稳定性的影响.光子学报,34(6),873.
MLA 张东平,et al."微缺陷对薄膜滤光片环境稳定性的影响".光子学报 34.6(2005):873.

入库方式: OAI收割

来源:上海光学精密机械研究所

浏览0
下载0
收藏0
其他版本

除非特别说明,本系统中所有内容都受版权保护,并保留所有权利。