中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
Influence of buffer layer thickness on the structure and optical properties of ZnO thin films

文献类型:期刊论文

作者Hong RJ(洪瑞金) ; Shao JD(邵建达) ; He HB(贺洪波) ; Fan ZX(范正修)
刊名appl. surf. sci.
出版日期2006
卷号252期号:8页码:2888
关键词zinc oxide sputtering structure photoluminescence
ISSN号0169-4332
中文摘要a series of zno thin films were deposited on zno buffer layers by dc reactive magnetron sputtering. the buffer layer thickness determination of microstructure and optical properties of zno films was investigated by x-ray diffraction (xrd), photoluminescence (pl), optical transmittance and absorption measurements. xrd results revealed that the stress of zno thin films varied with the buffer layer thickness. with the increase of buffer layer thickness, the band gap edge shifted toward longer wavelength. the near-band-edge (nbe) emission intensity of zno films deposited on zno buffer layer also varied with the increase of thickness due to the spatial confinement increasing the coulomb interaction between electrons and holes. the pl measurement showed that the optimum thickness of the zno buffer layer was around 12 nm. (c) 2005 elsevier b.v. all rights reserved.
学科主题光学薄膜
收录类别EI
语种英语
WOS记录号WOS:000235721800029
公开日期2009-09-22
源URL[http://ir.siom.ac.cn/handle/181231/4186]  
专题上海光学精密机械研究所_光学薄膜技术研究与发展中心
推荐引用方式
GB/T 7714
Hong RJ,Shao JD,He HB,et al. Influence of buffer layer thickness on the structure and optical properties of ZnO thin films[J]. appl. surf. sci.,2006,252(8):2888, 2893.
APA 洪瑞金,邵建达,贺洪波,&范正修.(2006).Influence of buffer layer thickness on the structure and optical properties of ZnO thin films.appl. surf. sci.,252(8),2888.
MLA 洪瑞金,et al."Influence of buffer layer thickness on the structure and optical properties of ZnO thin films".appl. surf. sci. 252.8(2006):2888.

入库方式: OAI收割

来源:上海光学精密机械研究所

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