Laser induced damage of multi-layer dielectric used in pulse compressor gratings
文献类型:期刊论文
作者 | Weijin Kong ; Yuanan Zhao ; Tao Wang ; Shao JD(邵建达) ; Fan ZX(范正修) |
刊名 | chin. opt. lett.
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出版日期 | 2005 |
卷号 | 3期号:3页码:181 |
关键词 | 140.3330 laser damage 310.6860 thin films optical properties 230.1950 diffraction gratings |
ISSN号 | 1671-7694 |
中文摘要 | laser induced damage threshold (lidt) of multi-layer dielectric used in pulse compressor gratings (pcg) was investigated. the sample was prepared by e-beam evaporation (ebe). lidt was detected following iso standard 11254-1.2. it was found that lidts of normal and 51.2 deg. incidence (transverse electric (te) mode) were 14.14 and 9.31 j/cm2, respectively. a nomarski microscope was employed to map the damage morphology, and it was found that the damage behavior was pit-concave-plat structure for normal incidence, while it was pit structure for 51.2 deg. incidence with te mode. the electric field distribution was calculated to illuminate the difference of lidt between the two incident cases. |
学科主题 | 光学薄膜 |
收录类别 | EI |
语种 | 英语 |
公开日期 | 2009-09-22 |
源URL | [http://ir.siom.ac.cn/handle/181231/4188] ![]() |
专题 | 上海光学精密机械研究所_光学薄膜技术研究与发展中心 |
推荐引用方式 GB/T 7714 | Weijin Kong,Yuanan Zhao,Tao Wang,et al. Laser induced damage of multi-layer dielectric used in pulse compressor gratings[J]. chin. opt. lett.,2005,3(3):181, 183. |
APA | Weijin Kong,Yuanan Zhao,Tao Wang,邵建达,&范正修.(2005).Laser induced damage of multi-layer dielectric used in pulse compressor gratings.chin. opt. lett.,3(3),181. |
MLA | Weijin Kong,et al."Laser induced damage of multi-layer dielectric used in pulse compressor gratings".chin. opt. lett. 3.3(2005):181. |
入库方式: OAI收割
来源:上海光学精密机械研究所
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