中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
Wideband antireflection film fabricated by glancing angle deposition

文献类型:期刊论文

作者Fu XY ; Wang SM ; Deng DG(邓德刚) ; Yi K ; Shao JD(邵建达) ; Fan ZX(范正修)
刊名chin. phys. lett.
出版日期2005
卷号22期号:12页码:3173
关键词SCULPTURED THIN-FILMS POROUS SILICON COATINGS INDEX LAYER
ISSN号0256-307x
中文摘要graded-index zro2 films has been fabricated on k9 glass by glancing angle deposition. because the index mismatch at the interface has been reduced, the film results in wideband high-transmission antireflection. from 400nm to 1200nm, the film reflection is lower than 0.8% and the lowest value is 0.2% at 432nm.
学科主题光学薄膜
收录类别0
语种英语
WOS记录号WOS:000233799600053
公开日期2009-09-22
源URL[http://ir.siom.ac.cn/handle/181231/4206]  
专题上海光学精密机械研究所_光学薄膜技术研究与发展中心
推荐引用方式
GB/T 7714
Fu XY,Wang SM,Deng DG,et al. Wideband antireflection film fabricated by glancing angle deposition[J]. chin. phys. lett.,2005,22(12):3173, 3175.
APA Fu XY,Wang SM,邓德刚,Yi K,邵建达,&范正修.(2005).Wideband antireflection film fabricated by glancing angle deposition.chin. phys. lett.,22(12),3173.
MLA Fu XY,et al."Wideband antireflection film fabricated by glancing angle deposition".chin. phys. lett. 22.12(2005):3173.

入库方式: OAI收割

来源:上海光学精密机械研究所

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