Investigation on the properties of high reflective mirror prepared by ion-beam sputtering
文献类型：期刊论文
| 作者 | Jianbing Huang ; Guanglei Tian ; Jianda Shao ; Fan ZX(范正修) |
| 刊名 | chin. opt. lett.
 |
| 出版日期 | 2005 |
| 卷号 | 3期号:11页码:676 |
| 关键词 | thin films 310.6870 thin films other properties |
| ISSN号 | 1671-7694 |
| 其他题名 | investigation on the properties of high reflective mirror prepared by ion-beam sputtering |
| 中文摘要 | the single-sided and dual-sided high reflective mirrors were deposited with ion-beam sputtering (ibs). when the incident light entered with 45 degrees, the reflectance of p-polarized light at 1064 nm exceeded 99.5%. spectrum was gained by spectrometer and weak absorption of coatings was measured by surface thermal lensing (stl) technique. laser-induced damage threshold (lidt) was determined and the damage morphology was observed with lecia-dmrxe microscope simultaneously. the profile of coatings was measured with mark iii-gpi digital interferometer. it was found that the reflectivity of mirror exceeded 99.9% and its absorption was as low as 14 ppm. the reflective bandwidth of the dual-sided sample was about 43 nm wider than that of single-sided sample, and its lidt was as high as 28 j/cm2, which was 5 j/cm2 higher than that of single-sided sample. moreover, the profile of dual-sided sample was better than that of substrate without coatings. |
| 学科主题 | 光学薄膜 |
| 收录类别 | EI |
| 语种 | 英语 |
| 公开日期 | 2009-09-22 |
| 源URL | [http://ir.siom.ac.cn/handle/181231/4422]  |
| 专题 | 上海光学精密机械研究所_光学薄膜技术研究与发展中心 |
| 推荐引用方式 GB/T 7714 | Jianbing Huang,Guanglei Tian,Jianda Shao,et al. Investigation on the properties of high reflective mirror prepared by ion-beam sputtering[J]. chin. opt. lett.,2005,3(11):676, 678. |
| APA | Jianbing Huang,Guanglei Tian,Jianda Shao,&范正修.(2005).Investigation on the properties of high reflective mirror prepared by ion-beam sputtering.chin. opt. lett.,3(11),676. |
| MLA | Jianbing Huang,et al."Investigation on the properties of high reflective mirror prepared by ion-beam sputtering".chin. opt. lett. 3.11(2005):676. |
入库方式： OAI收割
来源：上海光学精密机械研究所
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