Investigation of damage threshold to TiO2 coatings at different laser wavelength and pulse duration
文献类型：期刊论文
| 作者 | Yao JK(姚建可) ; Fan ZX(范正修) ; Jin Yunxia ; Zhao Yuanan ; He HB(贺洪波) ; Shao JD(邵建达) |
| 刊名 | thin solid films
 |
| 出版日期 | 2008 |
| 卷号 | 516期号:6页码:1237 |
| 关键词 | TiO2 monolayer TiO2/SiO2 high reflectors laser damage laser wavelength pulse duration X-ray photoelectron spectroscopy |
| ISSN号 | 0040-6090 |
| 中文摘要 | laser-induced damages to tio2 single layers and tio2/sio2 high reflectors at laser wavelength of 1064 nm, 800 run, 532 urn, and pulse width of 12 ns, 220 ps, 50 fs, 8 ns are investigated. all films are prepared by electron beam evaporation. the relations among microstructure, chemical composition, optical properties and laser-induced damage threshold (lidt), have been researched. the dependence of damage mechanism on laser wavelength and pulse width is discussed. it is found that from 1064 nm to 532 nm, lidt is mainly absorption related, which is determined by film's extinction coefficient and stoichiometric defects. the rapid decrease of lidt at 800 nm is due to the pulse width factor. tio2 coatings are mainly thermally by damaged at long pulse (tau >= 220 ps). the damage shows ablation feature at 50 fs. (c) 2007 elsevier b.v. all rights reserved. |
| 学科主题 | 光学薄膜 |
| 收录类别 | EI |
| 语种 | 英语 |
| 公开日期 | 2009-09-22 |
| 源URL | [http://ir.siom.ac.cn/handle/181231/4664]  |
| 专题 | 上海光学精密机械研究所_光学薄膜技术研究与发展中心 |
| 推荐引用方式 GB/T 7714 |
Yao JK,Fan ZX,Jin Yunxia,et al. Investigation of damage threshold to TiO |
| APA |
姚建可,范正修,Jin Yunxia,Zhao Yuanan,贺洪波,&邵建达.(2008).Investigation of damage threshold to TiO |
| MLA |
姚建可,et al."Investigation of damage threshold to TiO |
入库方式： OAI收割
来源：上海光学精密机械研究所
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