中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
Working pressure dependence of properties of Al2O3 thin films prepared by electron beam evaporation

文献类型:期刊论文

作者Zhan MQ(占美琼) ; Wu Zhong-Lin ; Fan Zheng-Xiu
刊名chin. phys. lett.
出版日期2008
卷号25期号:2页码:563
关键词INDUCED DAMAGE THRESHOLD ASSISTED DEPOSITION LASER DAMAGE COATINGS HFO2 SIO2
ISSN号0256-307x
中文摘要the effects of working pressure on properties of al2o3 thin films are investigated. transmittance of the al2o3 thin film is measured by a lambda 900 spectrometer. laser-induced damage threshold (lidt) is measured by a nd:yag laser at 355nm with a pulse width of 7ns. microdefects were observed under a nomarski microscope. the samples are characterized by optical properties and defect, as well as lidt under the 355 nm nd: yag laser radiation. it is found that the working pressure has fundamental effect on the lidt. it is the absorption rather than the microdefect that plays an important role on the lid t of al2o3 thin film.
学科主题光学薄膜
语种英语
WOS记录号WOS:000253316600057
公开日期2009-09-22
源URL[http://ir.siom.ac.cn/handle/181231/4670]  
专题上海光学精密机械研究所_光学薄膜技术研究与发展中心
推荐引用方式
GB/T 7714
Zhan MQ,Wu Zhong-Lin,Fan Zheng-Xiu. Working pressure dependence of properties of Al2O3 thin films prepared by electron beam evaporation[J]. chin. phys. lett.,2008,25(2):563, 565.
APA 占美琼,Wu Zhong-Lin,&Fan Zheng-Xiu.(2008).Working pressure dependence of properties of Al2O3 thin films prepared by electron beam evaporation.chin. phys. lett.,25(2),563.
MLA 占美琼,et al."Working pressure dependence of properties of Al2O3 thin films prepared by electron beam evaporation".chin. phys. lett. 25.2(2008):563.

入库方式: OAI收割

来源:上海光学精密机械研究所

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