Optical fringe multiplication technique with TEM nano-moiré method
文献类型：期刊论文
| 作者 | Xie HM; Liu ZW ; Fang DN; Dai FL; Xing YM; Zhao YP(赵亚溥)
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| 刊名 | Measurement Science & Technology
 |
| 出版日期 | 2005 |
| 卷号 | 16期号:2页码:529-534 |
| ISSN号 | 0957-0233 |
| 中文摘要 | In this paper, a nano-moiré fringe multiplication method is proposed, which can be used to measure nano-deformation of single crystal materials. The lattice structure of Si (111) is recorded on a film at a given magnification under a transmission microscope, which acts as a specimen grating. A parallel grating (binary type) on glass or film is selected as a reference grating. A multiplied nano-moiré fringe pattern can be reproduced in a 4f optical filter system with the specimen grating and the prepared reference grating. The successful results illustrate that this method can be used to measure deformation in nanometre scale. The method is especially useful in the measurement of the inhomogeneous displacement field, and can be utilized to characterize nano-mechanical behaviour of materials such as dislocation and atomic bond failure. |
| 学科主题 | 力学 |
| 类目[WOS] | Engineering, Multidisciplinary ; Instruments & Instrumentation |
| 研究领域[WOS] | Engineering ; Instruments & Instrumentation |
| 收录类别 | SCI |
| 语种 | 英语 |
| WOS记录号 | WOS:000227139700028 |
| 公开日期 | 2007-06-15 ; 2007-12-05 ; 2009-06-23 |
| 源URL | [http://dspace.imech.ac.cn/handle/311007/16674]  |
| 专题 | 力学研究所_力学所知识产出(1956-2008) |
| 推荐引用方式 GB/T 7714 | Xie HM,Liu ZW,Fang DN,et al. Optical fringe multiplication technique with TEM nano-moiré method[J]. Measurement Science & Technology,2005,16(2):529-534. |
| APA | Xie HM,Liu ZW,Fang DN,Dai FL,Xing YM,&赵亚溥.(2005).Optical fringe multiplication technique with TEM nano-moiré method.Measurement Science & Technology,16(2),529-534. |
| MLA | Xie HM,et al."Optical fringe multiplication technique with TEM nano-moiré method".Measurement Science & Technology 16.2(2005):529-534. |
入库方式： OAI收割
来源：力学研究所
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