中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
Extracting nanowire mechanical properties from three-point bendig test

文献类型:会议论文

作者Liu Y; Zhang Y(张吟); Liu, Y.; Liu, Y.; Liu, Y.; Liu, Y.; Liu, Y.; Liu, Y.; Liu, Y.
出版日期2010
会议名称2010 12th IEEE Intersociety Conference on Thermal and Thermomechanical Phenomena in Electronic Systems, ITherm 2010
会议日期June 2, 2010 - June 5, 2010
会议地点Las Vegas, NV, United states
关键词Changing trends Elastic medium Experimental data Nanowire materials Receding contact Significant impacts Three-point bending test Young's Modulus
通讯作者Liu, Y.
中文摘要A new adhesive receding contact model is presented in this paper for the nanowire in three-point bending test. Because of its flexurality, the nanowire in test may lift-off/separate from its supporting elastic medium, which can dramatically change the nanowire boundary conditions and deformations. The changes of the nanowire boundary conditions and deformations have the significant impact on the interpretation of the experimental data on the nanowire material properties. Through the model developed here, some explanations are offered to the different even contradicting observations on the nanowire material properties and the nanowire boundary conditions changing trends found in recent experiments. ©2010 IEEE.
收录类别CPCI-S ; EI
会议网址10.1109/ITHERM.2010.5501304
会议录2010 12th IEEE Intersociety Conference on Thermal and Thermomechanical Phenomena in Electronic Systems, ITherm 2010
语种英语
ISBN号9781424453429
WOS记录号WOS:000287517900143
源URL[http://dspace.imech.ac.cn/handle/311007/60347]  
专题力学研究所_非线性力学国家重点实验室
通讯作者Liu, Y.; Liu, Y.; Liu, Y.; Liu, Y.; Liu, Y.; Liu, Y.; Liu, Y.
推荐引用方式
GB/T 7714
Liu Y,Zhang Y,Liu, Y.,et al. Extracting nanowire mechanical properties from three-point bendig test[C]. 见:2010 12th IEEE Intersociety Conference on Thermal and Thermomechanical Phenomena in Electronic Systems, ITherm 2010. Las Vegas, NV, United states. June 2, 2010 - June 5, 2010.10.1109/ITHERM.2010.5501304.

入库方式: OAI收割

来源:力学研究所

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