Extracting nanowire mechanical properties from three-point bendig test
文献类型:会议论文
作者 | Liu Y; Zhang Y(张吟)![]() |
出版日期 | 2010 |
会议名称 | 2010 12th IEEE Intersociety Conference on Thermal and Thermomechanical Phenomena in Electronic Systems, ITherm 2010 |
会议日期 | June 2, 2010 - June 5, 2010 |
会议地点 | Las Vegas, NV, United states |
关键词 | Changing trends Elastic medium Experimental data Nanowire materials Receding contact Significant impacts Three-point bending test Young's Modulus |
通讯作者 | Liu, Y. |
中文摘要 | A new adhesive receding contact model is presented in this paper for the nanowire in three-point bending test. Because of its flexurality, the nanowire in test may lift-off/separate from its supporting elastic medium, which can dramatically change the nanowire boundary conditions and deformations. The changes of the nanowire boundary conditions and deformations have the significant impact on the interpretation of the experimental data on the nanowire material properties. Through the model developed here, some explanations are offered to the different even contradicting observations on the nanowire material properties and the nanowire boundary conditions changing trends found in recent experiments. ©2010 IEEE. |
收录类别 | CPCI-S ; EI |
会议网址 | 10.1109/ITHERM.2010.5501304 |
会议录 | 2010 12th IEEE Intersociety Conference on Thermal and Thermomechanical Phenomena in Electronic Systems, ITherm 2010
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语种 | 英语 |
ISBN号 | 9781424453429 |
WOS记录号 | WOS:000287517900143 |
源URL | [http://dspace.imech.ac.cn/handle/311007/60347] ![]() |
专题 | 力学研究所_非线性力学国家重点实验室 |
通讯作者 | Liu, Y.; Liu, Y.; Liu, Y.; Liu, Y.; Liu, Y.; Liu, Y.; Liu, Y. |
推荐引用方式 GB/T 7714 | Liu Y,Zhang Y,Liu, Y.,et al. Extracting nanowire mechanical properties from three-point bendig test[C]. 见:2010 12th IEEE Intersociety Conference on Thermal and Thermomechanical Phenomena in Electronic Systems, ITherm 2010. Las Vegas, NV, United states. June 2, 2010 - June 5, 2010.10.1109/ITHERM.2010.5501304. |
入库方式: OAI收割
来源:力学研究所
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