Electrical instability in vanadyl-phthalocyanine thin-film transistors
文献类型：期刊论文
| 作者 | Wang LJ ; Liu GJ ; Zhu F ; Pan F ; Yan DH |
| 刊名 | applied physics letters
 |
| 出版日期 | 2008 |
| 卷号 | 93期号:17页码:文献编号：173303 |
| 关键词 | FIELD-EFFECT TRANSISTORS STABILITY DEPENDENCE TIME |
| ISSN号 | 0003-6951 |
| 通讯作者 | yan dh |
| 中文摘要 | we investigated the electrical instability of vanadyl-phthalocyanine (vopc) thin-film transistors (tfts) at various temperatures. the results demonstrate a slow threshold voltage shift in the bias stress process and a rapid recovery after the removal of bias stress, which indicates that a slower degradation process occurs in the on state while a faster removal in the off state of vopc tfts. the shift of threshold voltage comes from traps generated at the organic/dielectrics interface. additionally, a relaxation time of 10(7) s was obtained at room temperature according to the stretched exponential model, which is comparable to a-si: h tfts. therefore, vopc tfts are suitable to be applied in flat panel displays. |
| 收录类别 | SCI |
| 语种 | 英语 |
| WOS记录号 | WOS:000260571800086 |
| 公开日期 | 2010-04-14 |
| 源URL | [http://ir.ciac.jl.cn/handle/322003/10239]  |
| 专题 | 长春应用化学研究所_长春应用化学研究所知识产出_期刊论文 |
| 推荐引用方式 GB/T 7714 | Wang LJ,Liu GJ,Zhu F,et al. Electrical instability in vanadyl-phthalocyanine thin-film transistors[J]. applied physics letters,2008,93(17):文献编号：173303. |
| APA | Wang LJ,Liu GJ,Zhu F,Pan F,&Yan DH.(2008).Electrical instability in vanadyl-phthalocyanine thin-film transistors.applied physics letters,93(17),文献编号：173303. |
| MLA | Wang LJ,et al."Electrical instability in vanadyl-phthalocyanine thin-film transistors".applied physics letters 93.17(2008):文献编号：173303. |
入库方式： OAI收割
来源：长春应用化学研究所
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