中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
Surface potential images of polycrystalline organic semiconductors obtained by Kelvin probe force microscopy

文献类型:期刊论文

作者Huang HC ; Wang HB ; Zhang JD ; Yan DH
刊名applied physics a-materials science & processing
出版日期2009
卷号95期号:1页码:125-130
关键词FIELD-EFFECT TRANSISTORS THIN-FILM TRANSISTORS SOLAR-CELLS GRAIN-BOUNDARY WORK FUNCTION INTERFACE TRANSPORT RESISTANCE BLENDS
ISSN号0947-8396
通讯作者yan dh
中文摘要p-type copper phthalocyanine (cupc) and n-type hexadecafluorophthalocyanina-tocopper (f16cupc) polycrystalline films were investigated by kelvin probe force microscopy (kpfm). topographic and corresponding surface potential images are obtained simultaneously. surface potential images are related with the local work function of crystalline facets and potential barriers at the grain boundaries (gbs) in organic semiconductors. based on the spatial distribution of surface potential at gbs, donor- and acceptor-like trapping states in the grain boundaries (gbs) of p-cupc and n-f16cupc films are confirmed respectively.
收录类别SCI
语种英语
WOS记录号WOS:000263485600020
公开日期2010-05-04
源URL[http://202.98.16.49/handle/322003/11259]  
专题长春应用化学研究所_长春应用化学研究所知识产出_期刊论文
推荐引用方式
GB/T 7714
Huang HC,Wang HB,Zhang JD,et al. Surface potential images of polycrystalline organic semiconductors obtained by Kelvin probe force microscopy[J]. applied physics a-materials science & processing,2009,95(1):125-130.
APA Huang HC,Wang HB,Zhang JD,&Yan DH.(2009).Surface potential images of polycrystalline organic semiconductors obtained by Kelvin probe force microscopy.applied physics a-materials science & processing,95(1),125-130.
MLA Huang HC,et al."Surface potential images of polycrystalline organic semiconductors obtained by Kelvin probe force microscopy".applied physics a-materials science & processing 95.1(2009):125-130.

入库方式: OAI收割

来源:长春应用化学研究所

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