中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
Atomic force microscopy and surface-enhanced Raman scattering detection of DNA based on DNA-nanoparticle complexes

文献类型:期刊论文

作者Sun LL ; Sun YJ ; Xu FG ; Zhang Y ; Yang T ; Guo CL ; Liu ZL ; Li Z
刊名nanotechnology
出版日期2009
卷号20期号:12页码:文献编号:125502
关键词VIRUS TYPE-1 RNA PCR ASSAY SPECTROSCOPY MOLECULES PROBES SERS CATIONS PLASMA ACID
ISSN号0957-4484
通讯作者sun ll
中文摘要we report a simple method for the label-free detection of double-stranded dna using surface-enhanced raman scattering (sers). we prepared cetyltrimethylammonium bromide (ctab)-capped silver nanoparticles and a dna-nanoparticle complex by adding silver nanoparticles to lambda-dna solutions. in the present study, the utilization of ctab-capped silver nanoparticles facilitates the electrostatic interaction between dna molecules and silver nanoparticles; at the same time, the introduction of dna avoids adding aggregating agent for the formation of nanoparticle aggregates to obtain large enhancement of dna, because the dna acts as both the probe molecules and aggregating agent of ag nanoparticles.
收录类别SCI
语种英语
WOS记录号WOS:000263891400011
公开日期2010-05-04
源URL[http://202.98.16.49/handle/322003/11437]  
专题长春应用化学研究所_长春应用化学研究所知识产出_期刊论文
推荐引用方式
GB/T 7714
Sun LL,Sun YJ,Xu FG,et al. Atomic force microscopy and surface-enhanced Raman scattering detection of DNA based on DNA-nanoparticle complexes[J]. nanotechnology,2009,20(12):文献编号:125502.
APA Sun LL.,Sun YJ.,Xu FG.,Zhang Y.,Yang T.,...&Li Z.(2009).Atomic force microscopy and surface-enhanced Raman scattering detection of DNA based on DNA-nanoparticle complexes.nanotechnology,20(12),文献编号:125502.
MLA Sun LL,et al."Atomic force microscopy and surface-enhanced Raman scattering detection of DNA based on DNA-nanoparticle complexes".nanotechnology 20.12(2009):文献编号:125502.

入库方式: OAI收割

来源:长春应用化学研究所

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