A superior interfacial reliability of Fe-Ni UBM during high temperature storage
文献类型：期刊论文
| 作者 | Gao, Li-Yin ; Li, Cai-Fu ; Wan, Peng ; Liu, Zhi-Quan |
| 刊名 | JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS
 |
| 出版日期 | 2017-06-01 |
| 卷号 | 28期号:12页码:8537-8545 |
| ISSN号 | 0957-4522 |
| 通讯作者 | Li, CF ; Liu, ZQ (reprint author), Chinese Acad Sci, Inst Met Res, Shenyang Natl Lab Mat Sci, Shenyang 110016, Peoples R China. ; Liu, ZQ (reprint author), Univ Chinese Acad Sci, Beijing 100049, Peoples R China. |
| 中文摘要 | Ball shear test was conducted on the SnAgCu/Fe-Ni solder joints, as well as SnAgCu/Cu for comparison after reflow and 150 degrees C high temperature storage following the industrial JEDEC standards. According to microstructural observation, Fe-Ni UBMs show better diffusion barrier effect than Cu UBM, which form very thin FeSn2 or FeSn2+(Cu, Ni)(6)Sn-5 layers at the interface without any Kirkendall voids. With such thin IMC layers, the shear strengths of Fe-Ni solder joints were comparable to Cu solder joints, which are in the range of 6.3-6.4 mg/mu m(2) after reflow and then fall into 4.7-5.1 mg/mu m(2) after 1000 h storage. Statistic observations revealed four kinds of fracture mode among failed solder joints, which are ductile fracture, brittle fracture, UBM fracture and pad lift respectively. The UBM fracture is the most common failure mode for Cu solder joint due to the fast consumption and low mechanical strength of Cu UBM, while the ductile failure takes the majority for Fe-Ni UBMs although it gradually turned into brittle fracture later as the aging time increased. The related mechanism of fracture behavior was also discussed concerning the physical properties of interfacial IMCs. Combining the low IMC growth rate, the comparable shear strength and the ductile fracture mode, Fe-45Ni UBM is superior to Cu UBM on the interfacial reliability of high temperature storage. |
| 学科主题 | Engineering, Electrical & Electronic ; Materials Science, Multidisciplinary ; Physics, Applied ; Physics, Condensed Matter |
| 资助信息 | Natural Science Foundation of China [51401218]; Major National Science and Technology Program of China [2011ZX02602] |
| 收录类别 | SCI |
| 语种 | 英语 |
| 公开日期 | 2017-08-17 |
| 源URL | [http://ir.imr.ac.cn/handle/321006/78112]  |
| 专题 | 金属研究所_中国科学院金属研究所 |
| 推荐引用方式 GB/T 7714 | Gao, Li-Yin,Li, Cai-Fu,Wan, Peng,et al. A superior interfacial reliability of Fe-Ni UBM during high temperature storage[J]. JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS,2017,28(12):8537-8545. |
| APA | Gao, Li-Yin,Li, Cai-Fu,Wan, Peng,&Liu, Zhi-Quan.(2017).A superior interfacial reliability of Fe-Ni UBM during high temperature storage.JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS,28(12),8537-8545. |
| MLA | Gao, Li-Yin,et al."A superior interfacial reliability of Fe-Ni UBM during high temperature storage".JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS 28.12(2017):8537-8545. |
入库方式： OAI收割
来源：金属研究所
浏览0
下载0
收藏0
其他版本
除非特别说明，本系统中所有内容都受版权保护，并保留所有权利。