中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
Measuring method of diffraction efficiency for plane grating based on Fourier spectral technology

文献类型:期刊论文

作者Ma, Z. Y.; X. D. Qi; X. T. Li; S. W. Zhang; Bayanheshig; H. Z. Yu; H. L. Yu and Q. B. Jiao
刊名Applied Optics
出版日期2016
卷号55期号:3
英文摘要The structural, infrared (IR) and Raman spectroscopic properties of alkali-metal exchanged (Na+, K+, Rb+, Cs+) zeolites with the stilbite (STI) framework have been studied by Rietveld analysis of high-resolution synchrotron X-ray powder diffraction data, micro-Raman and synchrotron IR spectroscopy at ambient conditions. Ordered arrangements of the extra-framework cations (EFCs) and H2O molecules were found at the intersection of the 10- and 8-ring channels as well as framework distortions and deformations of the channel system caused by the EFCs distributions. The T(5)-T(5) distances along the chains of the structural building units range from 8.921(1) to 8.979(5) angstrom and scale with the size of EFCs in Na-, K-, Rb-, Cs-STI. Furthermore, our spectroscopic studies show a systematic increase of characteristic band frequencies for the 4- and 5-ring breathing vibration modes in the far-IR spectral region with the size of the EFCs. The frequencies of the ring vibrational bands in the IR and Raman spectra are very sensitive to the presence of specific EFCS, and framework distortion. (C) 2016 Elsevier Inc. All rights reserved.
收录类别SCI ; EI
语种英语
源URL[http://ir.ciomp.ac.cn/handle/181722/57139]  
专题长春光学精密机械与物理研究所_中科院长春光机所知识产出
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Ma, Z. Y.,X. D. Qi,X. T. Li,et al. Measuring method of diffraction efficiency for plane grating based on Fourier spectral technology[J]. Applied Optics,2016,55(3).
APA Ma, Z. Y..,X. D. Qi.,X. T. Li.,S. W. Zhang.,Bayanheshig.,...&H. L. Yu and Q. B. Jiao.(2016).Measuring method of diffraction efficiency for plane grating based on Fourier spectral technology.Applied Optics,55(3).
MLA Ma, Z. Y.,et al."Measuring method of diffraction efficiency for plane grating based on Fourier spectral technology".Applied Optics 55.3(2016).

入库方式: OAI收割

来源:长春光学精密机械与物理研究所

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