Complex impedance analysis on orientation effect of LaMn0.6Al0.4O3 thin films
文献类型：期刊论文
| 作者 | Wang, HG (Wang, Hongguang)1; Xiong, XQ (Xiong, Xinqian)1; Xu, JB (Xu, Jinbao)1; Wang, L (Wang, Lei)1; Bian, L (Bian, Liang)1; Ren, W (Ren, Wei)1; Chang, AM (Chang, Aimin)1
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| 刊名 | JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS
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| 出版日期 | 2015 |
| 卷号 | 26期号:1页码:369-376 |
| 通讯作者 | Xu, JB |
| 英文摘要 | Preferred (100)-oriented and complete (100)-oriented LaMn0.6Al0.4O3 thin films were deposited on (100)-LaNiO3-coated silicon substrates by spin-coating method. Complex impedance spectroscopy was used to provide a convincing evidence for the existence of grain and grain boundary that were separated in the frequency domain in impedance spectrum. It suggests that the better grain orientation is effective in lowering the resistivity and activation energy but with little influenced on grain boundary. The analysis of impedance dependent on frequency, reveals that the relaxation is a thermally activation process. The grain and grain boundary conduction obey the Arrhenius behavior with activation energy 1.2294-1.3273 eV. The mechanism associated with the change of the electrical properties of the thin films is discussed. |
| 收录类别 | SCI |
| WOS记录号 | WOS:000347697500052 |
| 源URL | [http://ir.xjipc.cas.cn/handle/365002/4886]  |
| 专题 | 新疆理化技术研究所_中国科学院特殊环境功能材料与器件重点试验室 新疆理化技术研究所_材料物理与化学研究室 |
| 作者单位 | 1.Chinese Acad Sci, Key Lab Funct Mat & Devices Special Environm, Xinjiang Key Lab Elect Informat Mat & Devices, Xinjiang Tech Inst Phys & Chem, Urumqi 830011, Peoples R China 2.Univ Chinese Acad Sci, Beijing 100049, Peoples R China |
| 推荐引用方式 GB/T 7714 | Wang, HG ,Xiong, XQ ,Xu, JB ,et al. Complex impedance analysis on orientation effect of LaMn0.6Al0.4O3 thin films[J]. JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS,2015,26(1):369-376. |
| APA | Wang, HG .,Xiong, XQ .,Xu, JB .,Wang, L .,Bian, L .,...&Chang, AM .(2015).Complex impedance analysis on orientation effect of LaMn0.6Al0.4O3 thin films.JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS,26(1),369-376. |
| MLA | Wang, HG ,et al."Complex impedance analysis on orientation effect of LaMn0.6Al0.4O3 thin films".JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS 26.1(2015):369-376. |
入库方式： OAI收割
来源：新疆理化技术研究所
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