中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
Ordered pattern formation from dewetting of polymer thin film with surface disturbance by capillary force lithography

文献类型:期刊论文

作者Luo CX ; Xing RB ; Han YC
刊名surface science
出版日期2004
卷号552期号:1-3页码:139-148
关键词NANOINDENTATION-INDUCED DEFECTS LIQUID-FILMS SELF-ORGANIZATION HETEROGENEOUS SURFACES INSTABILITY TRANSITIONS DYNAMICS
ISSN号0039-6028
通讯作者han yc
中文摘要the dewetting process of thin polystyrene (ps) film with built-in ordered disturbance by capillary force lithography (cfl) has. been investigated in situ by afm. two different phenomena are observed depending on the excess surface energy (deltaf(gamma)) of the system. when deltaf(gamma) is less than a certain critical value (i.e., the disturbance amplitude is under a critical value), the ps film would be flattened and become stable finally by heating above t-g. while, if the size of the disturbance amplitude is larger than the critical value, ordered ps liquid droplets form by further dewetting. the pattern formation mechanisms and influencing factors have been discussed in detail.
收录类别SCI
语种英语
WOS记录号WOS:000220123000018
公开日期2010-08-17
源URL[http://202.98.16.49/handle/322003/15227]  
专题长春应用化学研究所_长春应用化学研究所知识产出_期刊论文
推荐引用方式
GB/T 7714
Luo CX,Xing RB,Han YC. Ordered pattern formation from dewetting of polymer thin film with surface disturbance by capillary force lithography[J]. surface science,2004,552(1-3):139-148.
APA Luo CX,Xing RB,&Han YC.(2004).Ordered pattern formation from dewetting of polymer thin film with surface disturbance by capillary force lithography.surface science,552(1-3),139-148.
MLA Luo CX,et al."Ordered pattern formation from dewetting of polymer thin film with surface disturbance by capillary force lithography".surface science 552.1-3(2004):139-148.

入库方式: OAI收割

来源:长春应用化学研究所

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