中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
Study on the instability of organic field-effect transistors based on fluorinated copper phthalocyanine

文献类型:期刊论文

作者Yuan JF ; Zhang JD ; Wang J ; Yan DH ; Xu W
刊名thin solid films
出版日期2004
卷号450期号:2页码:316-319
关键词THIN-FILM TRANSISTORS CHARGE TRAPPING INSTABILITIES TRANSPORT
ISSN号0040-6090
通讯作者yuan jf
中文摘要the effects of positive and negative gate-bias stress on organic field-effect transistors (ofet) based on tantalum (ta)/tantalum pentoxide (ta2o5)/fluorinated copper phthalocyanine (f16cupc) structure are investigated as a function of stress time and stress temperature. it is shown that gate-bias stress induces a parallel threshold voltage shift (deltav(t)) of ofets without changes of field-effect mobility mu(ef) and sub-threshold slope (deltas). the deltav(t) is observed to be logarithmically dependent on time at high gate-bias appropriate to ofet operation. more importantly, the shift is directional, namely, be large shift under positive stress and almost do not move under negative stress. the threshold voltage shift is temperature dependent with activation energy of 0.51 ev we concluded that threshold voltage shift of the ofet with f16cupc as active layer is due to charge trapping in the insulator in which trapped carriers have redistribution.
收录类别SCI
语种英语
WOS记录号WOS:000220442100014
公开日期2010-08-17
源URL[http://ir.ciac.jl.cn/handle/322003/15437]  
专题长春应用化学研究所_长春应用化学研究所知识产出_期刊论文
推荐引用方式
GB/T 7714
Yuan JF,Zhang JD,Wang J,et al. Study on the instability of organic field-effect transistors based on fluorinated copper phthalocyanine[J]. thin solid films,2004,450(2):316-319.
APA Yuan JF,Zhang JD,Wang J,Yan DH,&Xu W.(2004).Study on the instability of organic field-effect transistors based on fluorinated copper phthalocyanine.thin solid films,450(2),316-319.
MLA Yuan JF,et al."Study on the instability of organic field-effect transistors based on fluorinated copper phthalocyanine".thin solid films 450.2(2004):316-319.

入库方式: OAI收割

来源:长春应用化学研究所

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