中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
Scanned probe oxidation on an octadecyl-terminated silicon (111) surface with an atomic force microscope: kinetic investigations in line patterning

文献类型:期刊论文

作者Yang ML ; Zheng ZK ; Liu YQ ; Zhang BL
刊名nanotechnology
出版日期2006
卷号17期号:1页码:330-337
关键词SELF-ASSEMBLED MONOLAYERS HYDROGEN-PASSIVATED SILICON FARADAIC CURRENT DETECTION FIELD-INDUCED OXIDATION ALKYL MONOLAYERS ORGANIC MONOLAYERS ANODIZATION LITHOGRAPHY CHEMICAL-MODIFICATION SURFACE MODIFICATION POROUS SILICON
ISSN号0957-4484
通讯作者zhang bl
中文摘要scanned probe oxidation (spo) nanolithography has been performed with an atomic force microscope (afm) on an octadecyl-terminated silicon (111) surface to create protuberant oxide line patterns under ambient conditions in contact mode. the kinetic investigations of this spo process indicate that the oxide line height increases linearly with applied voltage and decreases logarithmically with writing, speed. the oxide line width also tends to vary with the same law. the ambient humidity and the afm tip state can remarkably influence this process, too. as compared with traditional octadecylsilated sio2/si substrate, such a substrate can guarantee the spo with an obviously lowered voltage and a greatly increased writing speed. this study demonstrates that such alkylated silicon is a promising silicon-based substrate material for spo nanolithography.
收录类别SCI
语种英语
WOS记录号WOS:000234959200059
公开日期2010-08-17
源URL[http://ir.ciac.jl.cn/handle/322003/16181]  
专题长春应用化学研究所_长春应用化学研究所知识产出_期刊论文
推荐引用方式
GB/T 7714
Yang ML,Zheng ZK,Liu YQ,et al. Scanned probe oxidation on an octadecyl-terminated silicon (111) surface with an atomic force microscope: kinetic investigations in line patterning[J]. nanotechnology,2006,17(1):330-337.
APA Yang ML,Zheng ZK,Liu YQ,&Zhang BL.(2006).Scanned probe oxidation on an octadecyl-terminated silicon (111) surface with an atomic force microscope: kinetic investigations in line patterning.nanotechnology,17(1),330-337.
MLA Yang ML,et al."Scanned probe oxidation on an octadecyl-terminated silicon (111) surface with an atomic force microscope: kinetic investigations in line patterning".nanotechnology 17.1(2006):330-337.

入库方式: OAI收割

来源:长春应用化学研究所

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