中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
Manipulation, dissection, and lithography using modified tapping mode atomic force microscope

文献类型:期刊论文

作者Liu ZG ; Li Z ; Wei G ; Song YH ; Wang L ; Sun LL
刊名microscopy research and technique
出版日期2006
卷号69期号:12页码:998-1004
关键词SCANNING PROBE MICROSCOPE DNA-MOLECULES MICA SURFACE NANOPARTICLES LIQUID AIR
ISSN号1059-910x
通讯作者li z
中文摘要a modified tapping mode of the atomic force microscope (afm) was introduced for manipulation, dissection, and lithography. by sufficiently decreasing the amplitude of afm tip in the normal tapping mode and adjusting the setpoint, the tip-sample interaction can be efficiently controlled. this modified tapping mode has some characteristics of the afm contact mode and can be used to manipulate nanoparticles, dissect biomolecules, and make lithographs on various surfaces. this method did not need any additional equipment and it can be applied to any afm system.
收录类别SCI
语种英语
WOS记录号WOS:000242654600008
公开日期2010-08-17
源URL[http://ir.ciac.jl.cn/handle/322003/16345]  
专题长春应用化学研究所_长春应用化学研究所知识产出_期刊论文
推荐引用方式
GB/T 7714
Liu ZG,Li Z,Wei G,et al. Manipulation, dissection, and lithography using modified tapping mode atomic force microscope[J]. microscopy research and technique,2006,69(12):998-1004.
APA Liu ZG,Li Z,Wei G,Song YH,Wang L,&Sun LL.(2006).Manipulation, dissection, and lithography using modified tapping mode atomic force microscope.microscopy research and technique,69(12),998-1004.
MLA Liu ZG,et al."Manipulation, dissection, and lithography using modified tapping mode atomic force microscope".microscopy research and technique 69.12(2006):998-1004.

入库方式: OAI收割

来源:长春应用化学研究所

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