Formation of conducting layers on excimer-laser-irradiated polyimide film surfaces
文献类型:期刊论文
作者 | Qin ZY ; Huang XY ; Wang DK ; He TB ; Wang QY ; Zhang YS |
刊名 | surface and interface analysis
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出版日期 | 2000 |
卷号 | 29期号:8页码:514-518 |
关键词 | ABLATION POLYMERS TEMPERATURE RADIATION |
ISSN号 | 0142-2421 |
通讯作者 | he tb |
中文摘要 | conducting layers on krf excimer-laser-irradiated polyimide film surfaces were investigated by xps, sem and fourier transform infrared (ftir)-raman spectroscopy, analysis of polyimide residue after laser irradiation provided valuable insight into the nature of the formation of conducting layers. the subtle different between krf laser irradiation and the pyrolysis of polyimide was found by comparison of the formation process of conducting layers. a physical picture was presented to describe better the formation of conducting layers. under krf laser irradiation, polyimide films underwent thermal decomposition assisted by photoinduced direct bond breaking. polycrystalline graphite was subsequently formed as the product of the secondary addition reaction of carbon-enriched clusters, such reaction was supported by the remaining energy on the irradiated polyimide film surface. this result shows that the thermal process played an important role that was not just restricted to the formation of conducting layers, copyright (c) 2000 john wiley & sons, ltd. |
收录类别 | SCI收录期刊论文 |
语种 | 英语 |
WOS记录号 | WOS:000088932400005 |
公开日期 | 2010-11-04 |
源URL | [http://202.98.16.49/handle/322003/19599] ![]() |
专题 | 长春应用化学研究所_长春应用化学研究所知识产出_期刊论文 |
推荐引用方式 GB/T 7714 | Qin ZY,Huang XY,Wang DK,et al. Formation of conducting layers on excimer-laser-irradiated polyimide film surfaces[J]. surface and interface analysis,2000,29(8):514-518. |
APA | Qin ZY,Huang XY,Wang DK,He TB,Wang QY,&Zhang YS.(2000).Formation of conducting layers on excimer-laser-irradiated polyimide film surfaces.surface and interface analysis,29(8),514-518. |
MLA | Qin ZY,et al."Formation of conducting layers on excimer-laser-irradiated polyimide film surfaces".surface and interface analysis 29.8(2000):514-518. |
入库方式: OAI收割
来源:长春应用化学研究所
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