Attenuation of high rate in parameter measurement of high power laser
文献类型:期刊论文
作者 | Jiang XQ(姜秀青); Chen X(陈欣); Tang SX(唐顺兴); Guo YJ(郭亚晶); Jing YY(井媛媛); Zhu BQ(朱宝强) |
刊名 | 红外与激光工程
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出版日期 | 2016 |
卷号 | 45期号:S1页码:55 |
中文摘要 | 在高功率激光参数测量中,高倍率衰减方案设计是空间分布测量的关键。分析了远场测量光学系统,将95%环围能量直径作为评价远场测量系统的重要指标,明确了高倍率衰减对远场测量结果的影响,确立了高倍率衰减方案的设计原则。利用Virtual Lab软件,针对单个平板、成对平板、成对楔板三种常见的高倍率衰减方案,分析了衰减片摆放角度、位置、厚度、成对衰减片间距等因素对于远场测量系统的影响。针对焦距3 000 mm,F数为10的缩束系统,考虑杂散光对于远场测量的影响,优化得出最佳高倍率衰减方案。该方案下,远场像面处95% |
英文摘要 | In high power laser beam parameters measurement, attenuation scheme with high rate is key to far-field measurement. The far-field optical measurement system was analyzed and diameter of 95% encircled energy was used as important evaluation criterion of far-field measurement system. Measurement error of far-field optical measurement system and effect of attenuation with high rate on far-field measurement results were analyzed. Principle of attenuation scheme with high rate was established. By changing parameters of high attenuation rate in condition of single parallel plate, a pair of parallel plates and a pair of wedge flaps by Virtual Lab, influence of attenuation on the far-field measurement system was simulated and analyzed deeply. According to measurement system for f =3 000 mm and F =10, best attenuation scheme with high rate is designed. Diameter of 95% encircled energy of far-field image is 45.5 μm, or 3.54 times of diffraction limitation. ? 2016, Editorial Board of Journal of Infrared and Laser Engineering. All right reserved. |
源URL | [http://ir.siom.ac.cn/handle/181231/27936] ![]() |
专题 | 上海光学精密机械研究所_高功率激光物理国家实验室 |
作者单位 | 中国科学院上海光学精密机械研究所 |
推荐引用方式 GB/T 7714 | Jiang XQ,Chen X,Tang SX,et al. Attenuation of high rate in parameter measurement of high power laser[J]. 红外与激光工程,2016,45(S1):55. |
APA | 姜秀青,陈欣,唐顺兴,郭亚晶,井媛媛,&朱宝强.(2016).Attenuation of high rate in parameter measurement of high power laser.红外与激光工程,45(S1),55. |
MLA | 姜秀青,et al."Attenuation of high rate in parameter measurement of high power laser".红外与激光工程 45.S1(2016):55. |
入库方式: OAI收割
来源:上海光学精密机械研究所
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