Extending resolution of scanning optical microscopy beyond the Abbe limit through the assistance of InSb thin layers
文献类型：期刊论文
| 作者 | Ding, Chenliang; Wei, Jingsong; Li, Qisong; Liang, Xin; Wei, Tao |
| 刊名 | Opt. Lett.
 |
| 出版日期 | 2016 |
| 卷号 | 41期号:7页码:1550 |
| 通讯作者 | weijingsong@siom.ac.cn |
| 英文摘要 | The resolution of light imaging is required to extend beyond the Abbe limit to the subdiffraction, or even nanoscale. In this Letter, we propose to extend the resolution of scanning optical microscopy (SOM) beyond the Abbe limit as a kind of subdiffraction imaging technology through the assistance of InSb thin layers due to obvious nonlinear saturation absorption and reversible formation of an optical pinhole channel. The results show that the imaging resolution is greatly improved compared with the SOM itself. This work provides a way to improve the resolution of SOM without changing the SOM itself, but through the assistance of InSb thin layers. This is also a simple and practical way to extend the resolution of SOM beyond the Abbe limit. (C) 2016 Optical Society of America |
| 收录类别 | SCI |
| 资助信息 | National Natural Science Foundation of China (NSFC) [51172253, 61137002] |
| WOS记录号 | WOS:000373225400062 |
| 源URL | [http://ir.siom.ac.cn/handle/181231/28234]  |
| 专题 | 上海光学精密机械研究所_高密度光存储技术实验室 |
| 作者单位 | 中国科学院上海光学精密机械研究所 |
| 推荐引用方式 GB/T 7714 | Ding, Chenliang,Wei, Jingsong,Li, Qisong,et al. Extending resolution of scanning optical microscopy beyond the Abbe limit through the assistance of InSb thin layers[J]. Opt. Lett.,2016,41(7):1550. |
| APA | Ding, Chenliang,Wei, Jingsong,Li, Qisong,Liang, Xin,&Wei, Tao.(2016).Extending resolution of scanning optical microscopy beyond the Abbe limit through the assistance of InSb thin layers.Opt. Lett.,41(7),1550. |
| MLA | Ding, Chenliang,et al."Extending resolution of scanning optical microscopy beyond the Abbe limit through the assistance of InSb thin layers".Opt. Lett. 41.7(2016):1550. |
入库方式： OAI收割
来源：上海光学精密机械研究所
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