中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
Grayscale image recording on Ge2Sb2Te5 thin films through laser-induced structural evolution

文献类型:期刊论文

作者Zhang, Long; Wei, Jingsong; Zhang, Kui; Zhao, Hongxia; Wei, Tao
刊名Sci Rep
出版日期2017
卷号7
通讯作者weijingsong@siom.ac.cn ; lzhang@siom.ac.cn
英文摘要Chalcogenide Ge2Sb2Te5 thin films have been widely exploited as binary bit recording materials in optical and non-volatile electronic information storage, where the crystalline and amorphous states are marked as the information bits "0" and "1", respectively. In this work, we demonstrate the use of Ge2Sb2Te5 thin films as multi-level grayscale image recording materials. High-resolution grayscale images are recorded on Ge2Sb2Te5 thin films through taking advantage of laser-induced structural evolution characteristic. Experimental results indicate that the change of laser energy results in the structural evolution of Ge2Sb2Te5 thin films. The structural evolution induces the difference of electronic polarizability and reflectivity, and high-resolution grayscale images are recorded on Ge2Sb2Te5 thin films through direct laser writing method, accordingly.
资助信息National Natural Science Foundation of China [51672292, 61627826, 61137002]
收录类别SCI
WOS记录号WOS:000393872600001
源URL[http://ir.siom.ac.cn/handle/181231/28090]  
专题上海光学精密机械研究所_中科院强激光材料重点实验室
作者单位中国科学院上海光学精密机械研究所
推荐引用方式
GB/T 7714
Zhang, Long,Wei, Jingsong,Zhang, Kui,et al. Grayscale image recording on Ge2Sb2Te5 thin films through laser-induced structural evolution[J]. Sci Rep,2017,7.
APA Zhang, Long,Wei, Jingsong,Zhang, Kui,Zhao, Hongxia,&Wei, Tao.(2017).Grayscale image recording on Ge2Sb2Te5 thin films through laser-induced structural evolution.Sci Rep,7.
MLA Zhang, Long,et al."Grayscale image recording on Ge2Sb2Te5 thin films through laser-induced structural evolution".Sci Rep 7(2017).

入库方式: OAI收割

来源:上海光学精密机械研究所

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