中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
Measurement of the inhomogeneous broadening of a bi-exciton state in a quantum dot using Franson-type nonlocal interference

文献类型:期刊论文

作者YONG-NAN SUN; YANG ZOU; GENG CHEN; JIAN-SHUN TANG; HAI-QIAO NI; MI-FENG LI; GUO-WEI ZHA; ZHI-CHUAN NIU; YONG-JIAN HAN; CHUAN-FENG LI
刊名OPTICS EXPRESS
出版日期2017
卷号25期号:3页码:1778-1788
学科主题半导体物理
公开日期2018-06-15
源URL[http://ir.semi.ac.cn/handle/172111/28609]  
专题半导体研究所_半导体超晶格国家重点实验室
推荐引用方式
GB/T 7714
YONG-NAN SUN,YANG ZOU,GENG CHEN,et al. Measurement of the inhomogeneous broadening of a bi-exciton state in a quantum dot using Franson-type nonlocal interference[J]. OPTICS EXPRESS,2017,25(3):1778-1788.
APA YONG-NAN SUN.,YANG ZOU.,GENG CHEN.,JIAN-SHUN TANG.,HAI-QIAO NI.,...&GUANG-CAN GUO.(2017).Measurement of the inhomogeneous broadening of a bi-exciton state in a quantum dot using Franson-type nonlocal interference.OPTICS EXPRESS,25(3),1778-1788.
MLA YONG-NAN SUN,et al."Measurement of the inhomogeneous broadening of a bi-exciton state in a quantum dot using Franson-type nonlocal interference".OPTICS EXPRESS 25.3(2017):1778-1788.

入库方式: OAI收割

来源:半导体研究所

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