Measurement of the inhomogeneous broadening of a bi-exciton state in a quantum dot using Franson-type nonlocal interference
文献类型：期刊论文
| 作者 | YONG-NAN SUN; YANG ZOU; GENG CHEN; JIAN-SHUN TANG; HAI-QIAO NI; MI-FENG LI; GUO-WEI ZHA; ZHI-CHUAN NIU; YONG-JIAN HAN; CHUAN-FENG LI |
| 刊名 | OPTICS EXPRESS
 |
| 出版日期 | 2017 |
| 卷号 | 25期号:3页码:1778-1788 |
| 学科主题 | 半导体物理 |
| 公开日期 | 2018-06-15 |
| 源URL | [http://ir.semi.ac.cn/handle/172111/28609]  |
| 专题 | 半导体研究所_半导体超晶格国家重点实验室 |
| 推荐引用方式 GB/T 7714 | YONG-NAN SUN,YANG ZOU,GENG CHEN,et al. Measurement of the inhomogeneous broadening of a bi-exciton state in a quantum dot using Franson-type nonlocal interference[J]. OPTICS EXPRESS,2017,25(3):1778-1788. |
| APA | YONG-NAN SUN.,YANG ZOU.,GENG CHEN.,JIAN-SHUN TANG.,HAI-QIAO NI.,...&GUANG-CAN GUO.(2017).Measurement of the inhomogeneous broadening of a bi-exciton state in a quantum dot using Franson-type nonlocal interference.OPTICS EXPRESS,25(3),1778-1788. |
| MLA | YONG-NAN SUN,et al."Measurement of the inhomogeneous broadening of a bi-exciton state in a quantum dot using Franson-type nonlocal interference".OPTICS EXPRESS 25.3(2017):1778-1788. |
入库方式： OAI收割
来源：半导体研究所
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