Failure mechanisms of 2D silicon film anodes: in situ observations and simulations on crack evolution
文献类型：期刊论文
| 作者 | Yang L; Chen HS; Jiang HQ; Wei YJ(魏宇杰) ; Song WL; Fang DN(方岱宁)
|
| 刊名 | CHEMICAL COMMUNICATIONS
 |
| 出版日期 | 2018-04-18 |
| 卷号 | 54期号:32页码:3997-4000 |
| ISSN号 | 1359-7345 |
| DOI | 10.1039/c7cc09708e |
| 文献子类 | Article |
| 英文摘要 | An in situ optical system was used to observe the failure processes of two-dimensional silicon film anodes, suggesting a new debonding mode based on crack crushing. The stress evolution upon lithiation was quantitatively analyzed via fully coupled finite element simulations, confirming the crack crushing induced failure mechanisms in 2D silicon anodes. |
| 分类号 | 二类/Q1 |
| WOS关键词 | LITHIUM-ION BATTERIES ; FINITE-ELEMENT-ANALYSIS ; THIN-FILM ; POTENTIOSTATIC OPERATION ; CHEMICAL-EQUILIBRIUM ; RIGID SUBSTRATE ; ELECTRODES ; STRESS ; LITHIATION ; INSERTION |
| WOS研究方向 | Chemistry |
| 语种 | 英语 |
| WOS记录号 | WOS:000435250100018 |
| 资助机构 | National Natural Science Foundation of China(11672341 ; 973 Project(2015CB932500) ; Foundation for Innovative Research Groups of the National Natural Science Foundation of China(11521202) ; National Materials Genome Project(2016YFB0700600) ; Beijing Natural Science Foundation(16L00001) ; 111572002 ; 51302011) |
| 源URL | [http://dspace.imech.ac.cn/handle/311007/77513]  |
| 专题 | 力学研究所_非线性力学国家重点实验室 |
| 推荐引用方式 GB/T 7714 | Yang L,Chen HS,Jiang HQ,et al. Failure mechanisms of 2D silicon film anodes: in situ observations and simulations on crack evolution[J]. CHEMICAL COMMUNICATIONS,2018,54(32):3997-4000. |
| APA | Yang L,Chen HS,Jiang HQ,魏宇杰,Song WL,&方岱宁.(2018).Failure mechanisms of 2D silicon film anodes: in situ observations and simulations on crack evolution.CHEMICAL COMMUNICATIONS,54(32),3997-4000. |
| MLA | Yang L,et al."Failure mechanisms of 2D silicon film anodes: in situ observations and simulations on crack evolution".CHEMICAL COMMUNICATIONS 54.32(2018):3997-4000. |
入库方式： OAI收割
来源：力学研究所
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